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Kim, M. J., Lee, H. S., Lee, J. Y., Kim, T. W., Yoo, K. H., Kim, M. D. (2004) Effect of thermal annealing on the surface, optical, and structural properties of p-type ZnSe thin films grown on GaAs (100) substrates. Journal of Materials Science, 39. 323-327 doi:10.1023/b:jmsc.0000007766.16695.29

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Reference TypeJournal (article/letter/editorial)
TitleEffect of thermal annealing on the surface, optical, and structural properties of p-type ZnSe thin films grown on GaAs (100) substrates
JournalJournal of Materials Science
AuthorsKim, M. J.Author
Lee, H. S.Author
Lee, J. Y.Author
Kim, T. W.Author
Yoo, K. H.Author
Kim, M. D.Author
Year2004 (January)Volume39
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1023/b:jmsc.0000007766.16695.29Search in ResearchGate
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Mindat Ref. ID10001568Long-form Identifiermindat:1:5:10001568:7
GUID0
Full ReferenceKim, M. J., Lee, H. S., Lee, J. Y., Kim, T. W., Yoo, K. H., Kim, M. D. (2004) Effect of thermal annealing on the surface, optical, and structural properties of p-type ZnSe thin films grown on GaAs (100) substrates. Journal of Materials Science, 39. 323-327 doi:10.1023/b:jmsc.0000007766.16695.29
Plain TextKim, M. J., Lee, H. S., Lee, J. Y., Kim, T. W., Yoo, K. H., Kim, M. D. (2004) Effect of thermal annealing on the surface, optical, and structural properties of p-type ZnSe thin films grown on GaAs (100) substrates. Journal of Materials Science, 39. 323-327 doi:10.1023/b:jmsc.0000007766.16695.29
In(n.d.) Journal of Materials Science Vol. 39. Springer Science and Business Media LLC

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Lee, H. S., Lee, K. H., Kim, J. S., Park, H. L., Kim, T. W. (2004) Rapid thermal annealing effects on the optical properties in strained CdTe (100)/GaAs (100) heterostructures. Journal of Materials Science, 39. 7115-7117 doi:10.1023/b:jmsc.0000047562.80341.2b
Lee, H. S., Lee, J. Y., Kim, T. W., Kim, D. W., Cho, W. J. (2004) Formation mechanism of preferential c-axis oriented ZnO thin films grown on p-Si substrates. Journal of Materials Science, 39. 3525-3528 doi:10.1023/b:jmsc.0000026968.24617.f6
Shin, J. W., Lee, J. Y., Jung, J. H., Lee, I., Kim, T. W., Lee, H. S., Kim, M. D. (2007) Formation mechanisms of self-assembled ZnSe nanostructures on Cl-doped ZnSe thin films grown on (100) GaAs substrates. Applied Physics Letters, 91 (14). 141921pp. doi:10.1063/1.2795081
Jeon, H. C., Shon, Y., Kim, H. S., Li, M. K., Lee, S. J., Kang, T. W., Jung, J. H., Kim, T. W., Kim, H. S., Kim, M. D., Wang, K. L., Lee, J. J. (2007) Effect of Thermal Annealing on the Magnetic and the Optical Properties of (Ga1-xMnx)N Thin Films Grown on GaN Buffer Layers. Journal of the Korean Physical Society, 50 (6). 1921pp. doi:10.3938/jkps.50.1921
Kim, M. D., Park, H. S., Kim, T. W. (1998) Hydrogenation and annealing effects in p-type ZnSe thin films grown on GaAs (100) substrates. Journal of Applied Physics, 84 (6). 3125-3128 doi:10.1063/1.368510
LEE, D. U., JUNG, J. H., KIM, T. W., LEE, H. S., PARK, H. L., LEE, K. H. (2007) EFFECT OF SUBSTRATE TEMPERATURE ON THE STRUCTURAL AND THE OPTICAL PROPERTIES OF CdTe (100) EPITAXIAL FILMS GROWN ON GaAs (100) SUBSTRATES. Surface Review and Letters, 14 (4). 755-759 doi:10.1142/s0218625x07010202
Lee, S. J., Kim, D. Y., Kim, T. W. (2004) Formation of C54 TiSi2thin films by using high-temperature sputtering and rapid thermal annealing. Journal of Materials Science, 39. 3203-3205 doi:10.1023/b:jmsc.0000025860.31547.e5
KIM, D. W., CHO, W. J., KIM, T. W. (2005) Effect of thermal annealing on the structural and the optical properties of (Zn1?xCox)O thin films grown on p-Si (1 0 0) substrates. Journal of Materials Science, 40. 769-771 doi:10.1007/s10853-005-6320-y
Park, S. H., Kang, T. W., Kim, T. W. (2004) Effect of annealing on neutron-transmutation-doped GaN epilayers grown on sapphire substrates. Journal of Materials Science, 39. 3217-3219 doi:10.1023/b:jmsc.0000025864.93045.5f
Kim, M. D., Lee, H. S., Lee, J. Y., Kim, T. W., Yoo, K. H., Kim, G.-H. (2003) Formation process and lattice parameter of InAs/GaAs quantum dots. Journal of Materials Science Letters, 22 (24) 1767-1770 doi:10.1023/b:jmsl.0000005416.82116.7e
Park, Y. S., Kim, K. H., Lee, J. J., Kim, H. S., Kang, T. W., Jiang, H. X., Lin, J. Y. (2004) X-ray diffraction analysis of the defect structure in AlxGa1 - xN films grown by metalorganic chemical vapor deposition. Journal of Materials Science, 39. 1853-1855 doi:10.1023/b:jmsc.0000016202.96505.51
 
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