Huang, Zhida, Bensch, Wolfgang, Sigle, Wilfried, van Aken, Peter A., Kienle, Lorenz, Vitoya, Tonya, Modrow, Hartwig, Ressler, Thorsten (2008) The modification of MoO3 nanoparticles supported on mesoporous SBA-15: characterization using X-ray scattering, N2 physisorption, transmission electron microscopy, high-angle annular darkfield technique, Raman and XAFS spectroscopy. Journal of Materials Science, 43. 244-253 doi:10.1007/s10853-007-2173-x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | The modification of MoO3 nanoparticles supported on mesoporous SBA-15: characterization using X-ray scattering, N2 physisorption, transmission electron microscopy, high-angle annular darkfield technique, Raman and XAFS spectroscopy | ||
Journal | Journal of Materials Science | ||
Authors | Huang, Zhida | Author | |
Bensch, Wolfgang | Author | ||
Sigle, Wilfried | Author | ||
van Aken, Peter A. | Author | ||
Kienle, Lorenz | Author | ||
Vitoya, Tonya | Author | ||
Modrow, Hartwig | Author | ||
Ressler, Thorsten | Author | ||
Year | 2008 (January) | Volume | 43 |
Publisher | Springer Science and Business Media LLC | ||
DOI | doi:10.1007/s10853-007-2173-xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10006546 | Long-form Identifier | mindat:1:5:10006546:0 |
GUID | 0 | ||
Full Reference | Huang, Zhida, Bensch, Wolfgang, Sigle, Wilfried, van Aken, Peter A., Kienle, Lorenz, Vitoya, Tonya, Modrow, Hartwig, Ressler, Thorsten (2008) The modification of MoO3 nanoparticles supported on mesoporous SBA-15: characterization using X-ray scattering, N2 physisorption, transmission electron microscopy, high-angle annular darkfield technique, Raman and XAFS spectroscopy. Journal of Materials Science, 43. 244-253 doi:10.1007/s10853-007-2173-x | ||
Plain Text | Huang, Zhida, Bensch, Wolfgang, Sigle, Wilfried, van Aken, Peter A., Kienle, Lorenz, Vitoya, Tonya, Modrow, Hartwig, Ressler, Thorsten (2008) The modification of MoO3 nanoparticles supported on mesoporous SBA-15: characterization using X-ray scattering, N2 physisorption, transmission electron microscopy, high-angle annular darkfield technique, Raman and XAFS spectroscopy. Journal of Materials Science, 43. 244-253 doi:10.1007/s10853-007-2173-x | ||
In | (n.d.) Journal of Materials Science Vol. 43. Springer Science and Business Media LLC |
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