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Szybowicz, M., Makowiecki, J. (2012) Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy. Journal of Materials Science, 47. 1522-1530 doi:10.1007/s10853-011-5940-7

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Reference TypeJournal (article/letter/editorial)
TitleOrientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy
JournalJournal of Materials Science
AuthorsSzybowicz, M.Author
Makowiecki, J.Author
Year2012 (February)Volume47
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s10853-011-5940-7Search in ResearchGate
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Mindat Ref. ID10010889Long-form Identifiermindat:1:5:10010889:1
GUID0
Full ReferenceSzybowicz, M., Makowiecki, J. (2012) Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy. Journal of Materials Science, 47. 1522-1530 doi:10.1007/s10853-011-5940-7
Plain TextSzybowicz, M., Makowiecki, J. (2012) Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy. Journal of Materials Science, 47. 1522-1530 doi:10.1007/s10853-011-5940-7
In(n.d.) Journal of Materials Science Vol. 47. Springer Science and Business Media LLC

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