Reference Type | Journal (article/letter/editorial) |
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Title | Microstructural stability of the intermetallic Ti–45Al–2W–0.5Si–0.5B in the 800–980°C temperature range |
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Journal | Materials Science and Engineering: A |
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Authors | Zhou, L.Z. | Author |
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Lupinc, V. | Author |
Guo, J.T. | Author |
Year | 2003 (August) | Volume | 354 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0921-5093(02)00918-8Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10030263 | Long-form Identifier | mindat:1:5:10030263:3 |
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GUID | 0 |
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Full Reference | Zhou, L.Z., Lupinc, V., Guo, J.T. (2003) Microstructural stability of the intermetallic Ti–45Al–2W–0.5Si–0.5B in the 800–980°C temperature range. Materials Science and Engineering: A, 354. 97-105 doi:10.1016/s0921-5093(02)00918-8 |
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Plain Text | Zhou, L.Z., Lupinc, V., Guo, J.T. (2003) Microstructural stability of the intermetallic Ti–45Al–2W–0.5Si–0.5B in the 800–980°C temperature range. Materials Science and Engineering: A, 354. 97-105 doi:10.1016/s0921-5093(02)00918-8 |
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In | (n.d.) Materials Science and Engineering: A Vol. 354. Elsevier BV |
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