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Heinz, Walther, Pippan, Reinhard, Dehm, Gerhard (2010) Investigation of the fatigue behavior of Al thin films with different microstructure. Materials Science and Engineering: A, 527. 7757-7763 doi:10.1016/j.msea.2010.08.046

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of the fatigue behavior of Al thin films with different microstructure
JournalMaterials Science and Engineering: A
AuthorsHeinz, WaltherAuthor
Pippan, ReinhardAuthor
Dehm, GerhardAuthor
Year2010 (November)Volume527
PublisherElsevier BV
DOIdoi:10.1016/j.msea.2010.08.046Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10040578Long-form Identifiermindat:1:5:10040578:5
GUID0
Full ReferenceHeinz, Walther, Pippan, Reinhard, Dehm, Gerhard (2010) Investigation of the fatigue behavior of Al thin films with different microstructure. Materials Science and Engineering: A, 527. 7757-7763 doi:10.1016/j.msea.2010.08.046
Plain TextHeinz, Walther, Pippan, Reinhard, Dehm, Gerhard (2010) Investigation of the fatigue behavior of Al thin films with different microstructure. Materials Science and Engineering: A, 527. 7757-7763 doi:10.1016/j.msea.2010.08.046
In(n.d.) Materials Science and Engineering: A Vol. 527. Elsevier BV

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