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Ribárik, Gábor, Ungár, Tamás (2010) Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis. Materials Science and Engineering: A, 528. 112-121 doi:10.1016/j.msea.2010.08.059

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis
JournalMaterials Science and Engineering: A
AuthorsRibárik, GáborAuthor
Ungár, TamásAuthor
Year2010 (November)Volume528
PublisherElsevier BV
DOIdoi:10.1016/j.msea.2010.08.059Search in ResearchGate
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Mindat Ref. ID10040930Long-form Identifiermindat:1:5:10040930:1
GUID0
Full ReferenceRibárik, Gábor, Ungár, Tamás (2010) Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis. Materials Science and Engineering: A, 528. 112-121 doi:10.1016/j.msea.2010.08.059
Plain TextRibárik, Gábor, Ungár, Tamás (2010) Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis. Materials Science and Engineering: A, 528. 112-121 doi:10.1016/j.msea.2010.08.059
In(n.d.) Materials Science and Engineering: A Vol. 528. Elsevier BV

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Fan, Zhijian, Jóni, Bertalan, Xie, Lei, Ribárik, Gábor, Ungár, Tamás (2018) Dislocation structure in textured zirconium tensile-deformed along rolling and transverse directions determined by X-ray diffraction line profile analysis. Journal of Nuclear Materials, 502. 301-310 doi:10.1016/j.jnucmat.2018.02.026
Ungár, Tamás, Balogh, Levente, Ribárik, Gábor (2010) Defect-Related Physical-Profile-Based X-Ray and Neutron Line Profile Analysis. Metallurgical and Materials Transactions A, 41 (5). 1202-1209 doi:10.1007/s11661-009-9961-7
Gubicza, Jenő, Dragomir, Iuliana C., Ribárik, Gábor, Zhu, Yuntian T., Valiev, Ruslan, Ungár, Tamás (2003) Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis. Materials Science Forum, 414. 229-234 doi:10.4028/www.scientific.net/msf.414-415.229
Balogh, Levente, Ribárik, Gábor, Ungár, Tamás (2006) Stacking faults and twin boundaries in fcc crystals determined by x-ray diffraction profile analysis. Journal of Applied Physics, 100 (2). 23512pp. doi:10.1063/1.2216195
Csiszár, Gábor, Pantleon, Karen, Alimadadi, Hossein, Ribárik, Gábor, Ungár, Tamás (2012) Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis. Journal of Applied Crystallography, 45 (1). 61-70 doi:10.1107/s0021889811053234
Ungár, Tamás, Gubicza, Jenő, Ribárik, Gábor, Pantea, Cristian, Zerda, T.Waldek (2002) Microstructure of carbon blacks determined by X-ray diffraction profile analysis. Carbon, 40. 929-937 doi:10.1016/s0008-6223(01)00224-x
Gubicza, J., Kassem, M., Ribárik, G., Ungár, T. (2004) The microstructure of mechanically alloyed Al–Mg determined by X-ray diffraction peak profile analysis. Materials Science and Engineering: A, 372. 115-122 doi:10.1016/j.msea.2003.12.016
Fan, Zhijian, Jóni, Bertalan, Ribárik, Gábor, Ódor, Éva, Fogarassy, Zs, Ungár, Tamás (2019) The Microstructure and strength of a V–5Cr–5Ti alloy processed by high pressure torsion. Materials Science and Engineering: A, 758. 139-146 doi:10.1016/j.msea.2019.04.094
Ribárik, Gábor, Jóni, Bertalan, Ungár, Tamás (2020) The Convolutional Multiple Whole Profile (CMWP) Fitting Method, a Global Optimization Procedure for Microstructure Determination. Crystals, 10 (7) 623pp. doi:10.3390/cryst10070623
Ungár, Tamás, Balogh, L., Ribárik, Gábor (2008) Twinning, Dislocations and Grain Size in NanoSPD Materials Determined by X-Ray Diffraction. Materials Science Forum, 584. 571-578 doi:10.4028/www.scientific.net/msf.584-586.571
Jóni, Bertalan, Ódor, Éva, Maric, Mia, Pantleon, Wolfgang, Ungár, Tamás (2020) Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti. Crystals, 10 (8) 691pp. doi:10.3390/cryst10080691
 
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