Reference Type | Journal (article/letter/editorial) |
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Title | Microstructural refinement and deformation mode of Ti under cryogenic channel die compression |
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Journal | Materials Science and Engineering: A |
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Authors | Ahn, S.H. | Author |
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Chun, Y.B. | Author |
Yu, S.H. | Author |
Kim, K.H. | Author |
Hwang, S.K. | Author |
Year | 2010 (November) | Volume | 528 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.msea.2010.08.087Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10040936 | Long-form Identifier | mindat:1:5:10040936:3 |
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GUID | 0 |
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Full Reference | Ahn, S.H., Chun, Y.B., Yu, S.H., Kim, K.H., Hwang, S.K. (2010) Microstructural refinement and deformation mode of Ti under cryogenic channel die compression. Materials Science and Engineering: A, 528. 165-171 doi:10.1016/j.msea.2010.08.087 |
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Plain Text | Ahn, S.H., Chun, Y.B., Yu, S.H., Kim, K.H., Hwang, S.K. (2010) Microstructural refinement and deformation mode of Ti under cryogenic channel die compression. Materials Science and Engineering: A, 528. 165-171 doi:10.1016/j.msea.2010.08.087 |
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In | (n.d.) Materials Science and Engineering: A Vol. 528. Elsevier BV |
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