Yan, Yabin, Sumigawa, Takashi, Kitamura, Takayuki (2012) Effect of environment on fatigue strength of Cu/Si interface in nanoscale components. Materials Science and Engineering: A, 556. 147-154 doi:10.1016/j.msea.2012.06.070
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Effect of environment on fatigue strength of Cu/Si interface in nanoscale components | ||
Journal | Materials Science and Engineering: A | ||
Authors | Yan, Yabin | Author | |
Sumigawa, Takashi | Author | ||
Kitamura, Takayuki | Author | ||
Year | 2012 (October) | Volume | 556 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.msea.2012.06.070Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10043355 | Long-form Identifier | mindat:1:5:10043355:9 |
GUID | 0 | ||
Full Reference | Yan, Yabin, Sumigawa, Takashi, Kitamura, Takayuki (2012) Effect of environment on fatigue strength of Cu/Si interface in nanoscale components. Materials Science and Engineering: A, 556. 147-154 doi:10.1016/j.msea.2012.06.070 | ||
Plain Text | Yan, Yabin, Sumigawa, Takashi, Kitamura, Takayuki (2012) Effect of environment on fatigue strength of Cu/Si interface in nanoscale components. Materials Science and Engineering: A, 556. 147-154 doi:10.1016/j.msea.2012.06.070 | ||
In | (n.d.) Materials Science and Engineering: A Vol. 556. Elsevier BV |
See Also
These are possibly similar items as determined by title/reference text matching only.