Reference Type | Journal (article/letter/editorial) |
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Title | Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique |
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Journal | Le Journal de Physique IV |
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Authors | EROGLU, S. | Author |
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GALLOIS, B. | Author |
Year | 1993 (August) | Volume | 3 |
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Publisher | EDP Sciences |
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DOI | doi:10.1051/jp4:1993322Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10296032 | Long-form Identifier | mindat:1:5:10296032:9 |
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GUID | 0 |
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Full Reference | EROGLU, S., GALLOIS, B. (1993) Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993322 |
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Plain Text | EROGLU, S., GALLOIS, B. (1993) Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993322 |
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In | (n.d.) Le Journal de Physique IV Vol. 3. EDP Sciences |
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