ALLONGUE, P. (1994) In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface. Le Journal de Physique IV, 4. doi:10.1051/jp4:1994125
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface | ||
Journal | Le Journal de Physique IV | ||
Authors | ALLONGUE, P. | Author | |
Year | 1994 (January) | Volume | 4 |
Publisher | EDP Sciences | ||
DOI | doi:10.1051/jp4:1994125Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10296859 | Long-form Identifier | mindat:1:5:10296859:2 |
GUID | 0 | ||
Full Reference | ALLONGUE, P. (1994) In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface. Le Journal de Physique IV, 4. doi:10.1051/jp4:1994125 | ||
Plain Text | ALLONGUE, P. (1994) In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface. Le Journal de Physique IV, 4. doi:10.1051/jp4:1994125 | ||
In | (n.d.) Le Journal de Physique IV Vol. 4. EDP Sciences |
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