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Lynch, S., Greef, R., Stoemenos, J., Dartnell, N. J., Lloyd, N. S., Kern, P., Stuck, R., Crean, G. M. (1995) Characterisation of semi-insulating polysilicon oxygen doped silicon thin films. Materials Science and Technology, 11. 80-84 doi:10.1179/mst.1995.11.1.80

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Reference TypeJournal (article/letter/editorial)
TitleCharacterisation of semi-insulating polysilicon oxygen doped silicon thin films
JournalMaterials Science and Technology
AuthorsLynch, S.Author
Greef, R.Author
Stoemenos, J.Author
Dartnell, N. J.Author
Lloyd, N. S.Author
Kern, P.Author
Stuck, R.Author
Crean, G. M.Author
Year1995 (January)Volume11
PublisherInforma UK Limited
DOIdoi:10.1179/mst.1995.11.1.80Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10304090Long-form Identifiermindat:1:5:10304090:7
GUID0
Full ReferenceLynch, S., Greef, R., Stoemenos, J., Dartnell, N. J., Lloyd, N. S., Kern, P., Stuck, R., Crean, G. M. (1995) Characterisation of semi-insulating polysilicon oxygen doped silicon thin films. Materials Science and Technology, 11. 80-84 doi:10.1179/mst.1995.11.1.80
Plain TextLynch, S., Greef, R., Stoemenos, J., Dartnell, N. J., Lloyd, N. S., Kern, P., Stuck, R., Crean, G. M. (1995) Characterisation of semi-insulating polysilicon oxygen doped silicon thin films. Materials Science and Technology, 11. 80-84 doi:10.1179/mst.1995.11.1.80
In(n.d.) Materials Science and Technology Vol. 11. Informa UK Limited

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