| Reference Type | Journal (article/letter/editorial) |
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| Title | Sputter yield measurements of thin foils using scanning transmission ion microscopy |
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| Journal | The European Physical Journal D |
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| Authors | Eichhorn, Christoph | Author |
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| Manova, Darina | Author |
| Feder, René | Author |
| Wunderlich, Ralf | Author |
| Nömayr, Christel | Author |
| Zimmermann, Claus G. | Author |
| Neumann, Horst | Author |
| Year | 2015 (January) | Volume | 69 |
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| Publisher | Springer Science and Business Media LLC |
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| DOI | doi:10.1140/epjd/e2014-50552-1Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 10361183 | Long-form Identifier | mindat:1:5:10361183:1 |
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| GUID | 0 |
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| Full Reference | Eichhorn, Christoph, Manova, Darina, Feder, René, Wunderlich, Ralf, Nömayr, Christel, Zimmermann, Claus G., Neumann, Horst (2015) Sputter yield measurements of thin foils using scanning transmission ion microscopy. The European Physical Journal D, 69. doi:10.1140/epjd/e2014-50552-1 |
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| Plain Text | Eichhorn, Christoph, Manova, Darina, Feder, René, Wunderlich, Ralf, Nömayr, Christel, Zimmermann, Claus G., Neumann, Horst (2015) Sputter yield measurements of thin foils using scanning transmission ion microscopy. The European Physical Journal D, 69. doi:10.1140/epjd/e2014-50552-1 |
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| In | (n.d.) The European Physical Journal D Vol. 69. Springer Science and Business Media LLC |
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