Reference Type | Journal (article/letter/editorial) |
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Title | Ultrathin section preparation of phyllosilicates by Focused Ion Beam milling for quantitative analysis by TEM-EDX |
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Journal | Applied Clay Science |
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Authors | Bourdelle, Franck | Author |
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Parra, Teddy | Author |
Beyssac, Olivier | Author |
Chopin, Christian | Author |
Moreau, Florent | Author |
Year | 2012 (May) | Volume | 59 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.clay.2012.02.010Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10365092 | Long-form Identifier | mindat:1:5:10365092:2 |
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GUID | 0 |
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Full Reference | Bourdelle, Franck, Parra, Teddy, Beyssac, Olivier, Chopin, Christian, Moreau, Florent (2012) Ultrathin section preparation of phyllosilicates by Focused Ion Beam milling for quantitative analysis by TEM-EDX. Applied Clay Science, 59. 121-130 doi:10.1016/j.clay.2012.02.010 |
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Plain Text | Bourdelle, Franck, Parra, Teddy, Beyssac, Olivier, Chopin, Christian, Moreau, Florent (2012) Ultrathin section preparation of phyllosilicates by Focused Ion Beam milling for quantitative analysis by TEM-EDX. Applied Clay Science, 59. 121-130 doi:10.1016/j.clay.2012.02.010 |
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In | (2012) Applied Clay Science Vol. 59. Elsevier BV |
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