Meng, Yong, Gong, Guohong, Wei, Dongtian, Xie, Yumin (2016) In situ high temperature X-ray diffraction study on high strength aluminous porcelain insulator with the Al2O3-SiO2-K2O-Na2O system. Applied Clay Science, 132. 760-767 doi:10.1016/j.clay.2016.07.014
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In situ high temperature X-ray diffraction study on high strength aluminous porcelain insulator with the Al2O3-SiO2-K2O-Na2O system | ||
Journal | Applied Clay Science | ||
Authors | Meng, Yong | Author | |
Gong, Guohong | Author | ||
Wei, Dongtian | Author | ||
Xie, Yumin | Author | ||
Year | 2016 (November) | Volume | 132 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.clay.2016.07.014Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10366730 | Long-form Identifier | mindat:1:5:10366730:2 |
GUID | 0 | ||
Full Reference | Meng, Yong, Gong, Guohong, Wei, Dongtian, Xie, Yumin (2016) In situ high temperature X-ray diffraction study on high strength aluminous porcelain insulator with the Al2O3-SiO2-K2O-Na2O system. Applied Clay Science, 132. 760-767 doi:10.1016/j.clay.2016.07.014 | ||
Plain Text | Meng, Yong, Gong, Guohong, Wei, Dongtian, Xie, Yumin (2016) In situ high temperature X-ray diffraction study on high strength aluminous porcelain insulator with the Al2O3-SiO2-K2O-Na2O system. Applied Clay Science, 132. 760-767 doi:10.1016/j.clay.2016.07.014 | ||
In | (2016) Applied Clay Science Vol. 132. Elsevier BV |
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