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Olmstead, Marjorie A., Amer, Nabil M. (1984) Direct Measurement of the Polarization Dependence of Si(111)2Γ—1 Surface-State Absorption by Use of Photothermal Displacement Spectroscopy. Physical Review Letters, 52 (13). 1148-1151 doi:10.1103/physrevlett.52.1148

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Reference TypeJournal (article/letter/editorial)
TitleDirect Measurement of the Polarization Dependence of Si(111)2Γ—1 Surface-State Absorption by Use of Photothermal Displacement Spectroscopy
JournalPhysical Review Letters
AuthorsOlmstead, Marjorie A.Author
Amer, Nabil M.Author
Year1984 (March 26)Volume52
Issue13
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.52.1148Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10541644Long-form Identifiermindat:1:5:10541644:1
GUID0
Full ReferenceOlmstead, Marjorie A., Amer, Nabil M. (1984) Direct Measurement of the Polarization Dependence of Si(111)2Γ—1 Surface-State Absorption by Use of Photothermal Displacement Spectroscopy. Physical Review Letters, 52 (13). 1148-1151 doi:10.1103/physrevlett.52.1148
Plain TextOlmstead, Marjorie A., Amer, Nabil M. (1984) Direct Measurement of the Polarization Dependence of Si(111)2Γ—1 Surface-State Absorption by Use of Photothermal Displacement Spectroscopy. Physical Review Letters, 52 (13). 1148-1151 doi:10.1103/physrevlett.52.1148
In(1984, March) Physical Review Letters Vol. 52 (13) American Physical Society (APS)

See Also

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Olmstead, Marjorie A., Amer, Nabil M. (1984) Polarization dependence of Ge(111)2Γ—1 surface-state absorption using photothermal displacement spectroscopy: A test of surface reconstruction models. Physical Review B, 29 (12) 7048-7050 doi:10.1103/physrevb.29.7048
Olmstead, Marjorie A., Amer, Nabil M. (1986) Temperature dependence of the Si and Ge (111)2Γ—1 surface-state optical absorption. Physical Review B, 33 (4) 2564-2573 doi:10.1103/physrevb.33.2564
Olmstead, Marjorie A., Chadi, D. J. (1986) Theory of the temperature dependence of Si(111)2Γ—1 surface-state optical absorption. Physical Review B, 33 (12) 8402-8409 doi:10.1103/physrevb.33.8402
Jackson, Warren B., Amer, Nabil M. (1982) Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopy. Physical Review B, 25 (8) 5559-5562 doi:10.1103/physrevb.25.5559
Weinberger, B. R., Roxlo, C. B., Etemad, S., Baker, G. L., Orenstein, J. (1984) Optical Absorption in Polyacetylene: A Direct Measurement Using Photothermal Deflection Spectroscopy. Physical Review Letters, 53 (1). 86-89 doi:10.1103/physrevlett.53.86
Chiaradia, P., Cricenti, A., Selci, S., Chiarotti, G. (1984) Differential Reflectivity of Si(111)2Γ—1 Surface with Polarized Light: A Test for Surface Structure. Physical Review Letters, 52 (13). 1145-1147 doi:10.1103/physrevlett.52.1145
Hessinger, Uwe, Leskovar, M., Olmstead, Marjorie A. (1995) Role of Step and Terrace Nucleation in Heteroepitaxial Growth Morphology: Growth Kinetics of CaF2/Si(111). Physical Review Letters, 75 (12). 2380-2383 doi:10.1103/physrevlett.75.2380
Amer, Nabil M., Olmstead, Marjorie A. (1983) A novel method for the study of optical properties of surfaces. Surface Science, 132 (1). 68-72 doi:10.1016/0039-6028(83)90531-9
Fiori, Costantino (1984) Far-Ultraviolet Laser-Induced Oxidation at the Si(111) Surface by Bond Rearrangement. Physical Review Letters, 52 (23). 2077-2080 doi:10.1103/physrevlett.52.2077
Lynn, K. G., Frieze, W. E., Schultz, Peter J. (1984) Measurement of the Positron Surface-State Lifetime for Al. Physical Review Letters, 52 (13). 1137-1140 doi:10.1103/physrevlett.52.1137
Cardillo, Mark J., Becker, G. E. (1978) Diffraction of He Atoms at a Si(100) Surface. Physical Review Letters, 40 (17). 1148-1151 doi:10.1103/physrevlett.40.1148
 
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