Reference Type | Journal (article/letter/editorial) |
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Title | Breakdown Transients in Ultrathin Gate Oxides: Transition in the Degradation Rate |
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Journal | Physical Review Letters |
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Authors | Lombardo, S. | Author |
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Stathis, J. H. | Author |
Linder, B. P. | Author |
Year | 2003 (April 22) | Volume | 90 |
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Issue | 16 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrevlett.90.167601Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10588740 | Long-form Identifier | mindat:1:5:10588740:1 |
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GUID | 0 |
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Full Reference | Lombardo, S., Stathis, J. H., Linder, B. P. (2003) Breakdown Transients in Ultrathin Gate Oxides: Transition in the Degradation Rate. Physical Review Letters, 90 (16). doi:10.1103/physrevlett.90.167601 |
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Plain Text | Lombardo, S., Stathis, J. H., Linder, B. P. (2003) Breakdown Transients in Ultrathin Gate Oxides: Transition in the Degradation Rate. Physical Review Letters, 90 (16). doi:10.1103/physrevlett.90.167601 |
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In | (2003, April) Physical Review Letters Vol. 90 (16) American Physical Society (APS) |
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