Kumagai, Yoshiaki, Jurek, Zoltan, Xu, Weiqing, Fukuzawa, Hironobu, Motomura, Koji, Iablonskyi, Denys, Nagaya, Kiyonobu, Wada, Shin-ichi, Mondal, Subhendu, Tachibana, Tetsuya, Ito, Yuta, Sakai, Tsukasa, Matsunami, Kenji, Nishiyama, Toshiyuki, Umemoto, Takayuki, Nicolas, Christophe, Miron, Catalin, Togashi, Tadashi, Ogawa, Kanade, Owada, Shigeki, Tono, Kensuke, Yabashi, Makina, Son, Sang-Kil, Ziaja, Beata, Santra, Robin, Ueda, Kiyoshi (2018) Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses. Physical Review Letters, 120 (22). doi:10.1103/physrevlett.120.223201

See Also

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	Kumagai, Yoshiaki, Xu, Weiqing, Asa, Kazuki, Nishiyama, Toshiyuki Hiraki, Motomura, Koji, Wada, Shin-ichi, Iablonskyi, Denys, Mondal, Subhendu, Tachibana, Tetsuya, Ito, Yuta, Sakai, Tsukasa, Matsunami, Kenji, Umemoto, Takayuki, Nicolas, Christophe, Miron, Catalin, Togashi, Tadashi, Ogawa, Kanade, Owada, Shigeki, Tono, Kensuke, Yabashi, Makina, Fukuzawa, Hironobu, Nagaya, Kiyonobu, Ueda, Kiyoshi (2023) Ionization of Xenon Clusters by a Hard X-ray Laser Pulse. Applied Sciences, 13 (4) 2176 doi:10.3390/app13042176
	Nishiyama, Toshiyuki, Bostedt, Christoph, Ferguson, Ken R., Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Miron, Catalin, Nicolas, Christophe, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, Ueda, Kiyoshi (2019) Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Applied Sciences, 9. 4932pp. doi:10.3390/app9224932
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	Niozu, Akinobu, Kumagai, Yoshiaki, Nishiyama, Toshiyuki, Fukuzawa, Hironobu, Motomura, Koji, Bucher, Maximilian, Asa, Kazuki, Sato, Yuhiro, Ito, Yuta, Takanashi, Tsukasa, You, Daehyun, Ono, Taishi, Li, Yiwen, Kukk, Edwin, Miron, Catalin, Neagu, Liviu, Callegari, Carlo, Di Fraia, Michele, Rossi, Giorgio, Galli, Davide E., Pincelli, Tommaso, Colombo, Alessandro, Owada, Shigeki, Tono, Kensuke, Kameshima, Takashi, Joti, Yasumasa, Katayama, Tetsuo, Togashi, Tadashi, Yabashi, Makina, Matsuda, Kazuhiro, Nagaya, Kiyonobu, Bostedt, Christoph, Ueda, Kiyoshi (2020) Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays. IUCrJ, 7 (2). 276-286 doi:10.1107/s205225252000144x
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