Hartner, Richard, Walters, Steve G., Berry, Ron (2012) Integration and Analysis of Optical and Sem-Based Microscopy for Automated Mineralogical Characterisation. In Proceedings of the 10th International Congress for Applied Mineralogy (ICAM). Springer Berlin Heidelberg. p.319-326. doi:10.1007/978-3-642-27682-8_38
| Reference Type | Book (chapter) | ||
|---|---|---|---|
| Title | Integration and Analysis of Optical and Sem-Based Microscopy for Automated Mineralogical Characterisation | ||
| Book Title | Proceedings of the 10th International Congress for Applied Mineralogy (ICAM) | ISBN | 9783642276811 |
| Authors | Hartner, Richard | Author | |
| Walters, Steve G. | Author | ||
| Berry, Ron | Author | ||
| Year | 2012 | ||
| Publisher | Springer Berlin Heidelberg | ||
| DOI | doi:10.1007/978-3-642-27682-8_38Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 1119140 | Long-form Identifier | mindat:1:5:1119140:9 |
| GUID | 0 | ||
| Full Reference | Hartner, Richard, Walters, Steve G., Berry, Ron (2012) Integration and Analysis of Optical and Sem-Based Microscopy for Automated Mineralogical Characterisation. In Proceedings of the 10th International Congress for Applied Mineralogy (ICAM). Springer Berlin Heidelberg. p.319-326. doi:10.1007/978-3-642-27682-8_38 | ||
| Plain Text | Hartner, Richard, Walters, Steve G., Berry, Ron (2012) Integration and Analysis of Optical and Sem-Based Microscopy for Automated Mineralogical Characterisation. In Proceedings of the 10th International Congress for Applied Mineralogy (ICAM). Springer Berlin Heidelberg. p.319-326. doi:10.1007/978-3-642-27682-8_38 | ||
| In | Broekmans, Maarten A.T.M. - Ed. (2012) Proceedings of the 10th International Congress for Applied Mineralogy (ICAM). Springer Berlin Heidelberg. doi:10.1007/978-3-642-27682-8 | ||
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