Reference Type | Journal (article/letter/editorial) |
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Title | Re-Examination of Temperature Dependence of Dielectric Constants under High Pressure in Lead Orthovanadate Pb3(VO4)2Crystal |
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Journal | Journal of the Physical Society of Japan |
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Authors | Ishibashi, Yoshihiro | Author |
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Gesi, Kazuo | Author |
Year | 1993 (August 15) | Volume | 62 |
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Issue | 8 |
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Publisher | Physical Society of Japan |
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DOI | doi:10.1143/jpsj.62.2876Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 11204564 | Long-form Identifier | mindat:1:5:11204564:1 |
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GUID | 0 |
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Full Reference | Ishibashi, Yoshihiro, Gesi, Kazuo (1993) Re-Examination of Temperature Dependence of Dielectric Constants under High Pressure in Lead Orthovanadate Pb3(VO4)2Crystal. Journal of the Physical Society of Japan, 62 (8). 2876-2878 doi:10.1143/jpsj.62.2876 |
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Plain Text | Ishibashi, Yoshihiro, Gesi, Kazuo (1993) Re-Examination of Temperature Dependence of Dielectric Constants under High Pressure in Lead Orthovanadate Pb3(VO4)2Crystal. Journal of the Physical Society of Japan, 62 (8). 2876-2878 doi:10.1143/jpsj.62.2876 |
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In | (1993, August) Journal of the Physical Society of Japan Vol. 62 (8) Physical Society of Japan |
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