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Xue, Xiaobo, You, Biao, Pan, Jie, Rui, Wenbing, Zhang, Wei, Sun, Liang, Du, Jun, Yuan, Xueyong, Xu, Qingyu (2013) BiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers. Journal of the Korean Physical Society, 62 (12). 1950-1953 doi:10.3938/jkps.62.1950

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Reference TypeJournal (article/letter/editorial)
TitleBiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers
JournalJournal of the Korean Physical Society
AuthorsXue, XiaoboAuthor
You, BiaoAuthor
Pan, JieAuthor
Rui, WenbingAuthor
Zhang, WeiAuthor
Sun, LiangAuthor
Du, JunAuthor
Yuan, XueyongAuthor
Xu, QingyuAuthor
Year2013 (June)Volume62
Issue12
PublisherKorean Physical Society
DOIdoi:10.3938/jkps.62.1950Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11242404Long-form Identifiermindat:1:5:11242404:0
GUID0
Full ReferenceXue, Xiaobo, You, Biao, Pan, Jie, Rui, Wenbing, Zhang, Wei, Sun, Liang, Du, Jun, Yuan, Xueyong, Xu, Qingyu (2013) BiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers. Journal of the Korean Physical Society, 62 (12). 1950-1953 doi:10.3938/jkps.62.1950
Plain TextXue, Xiaobo, You, Biao, Pan, Jie, Rui, Wenbing, Zhang, Wei, Sun, Liang, Du, Jun, Yuan, Xueyong, Xu, Qingyu (2013) BiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers. Journal of the Korean Physical Society, 62 (12). 1950-1953 doi:10.3938/jkps.62.1950
In(2013, June) Journal of the Korean Physical Society Vol. 62 (12) Korean Physical Society


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