| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray powder diffraction of Ag2Te at temperatures up to 1123 K |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Schneider, J. | Author |
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| Schulz, H. | Author |
| Year | 1993 (January 1) | Volume | 203 |
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| Issue | 1 |
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| Publisher | Walter de Gruyter GmbH |
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| Download URL | https://rruff.info/doclib/zk/vol203/ZK203_1.pdf+ |
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| DOI | doi:10.1524/zkri.1993.203.part-1.1Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 113362 | Long-form Identifier | mindat:1:5:113362:6 |
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| GUID | 0 |
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| Full Reference | Schneider, J., Schulz, H. (1993) X-ray powder diffraction of Ag2Te at temperatures up to 1123 K. Zeitschrift für Kristallographie - Crystalline Materials, 203 (1) 1-15 doi:10.1524/zkri.1993.203.part-1.1 |
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| Plain Text | Schneider, J., Schulz, H. (1993) X-ray powder diffraction of Ag2Te at temperatures up to 1123 K. Zeitschrift für Kristallographie - Crystalline Materials, 203 (1) 1-15 doi:10.1524/zkri.1993.203.part-1.1 |
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| In | (1993, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 203 (1) Walter de Gruyter GmbH |
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| Abstract/Notes | AbstractX-ray powder diffraction was performed onRietveld profile refinement ofFor theThe first structure refinement of |
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