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Resel, Roland, Pichler, Alexander, Resel, Roland, Neuhold, Alfred, Dingemans, Theo, Schwabegger, Günther, Simbrunner, Clemens, Moret, Massimo, Salzmann, Ingo (2014) Crystal structure determination of organic thin-films: the example of 2,2′ :6′,2″-ternaphthalene. Zeitschrift für Kristallographie - Crystalline Materials, 229 (5) doi:10.1515/zkri-2013-1704

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Reference TypeJournal (article/letter/editorial)
TitleCrystal structure determination of organic thin-films: the example of 2,2′ :6′,2″-ternaphthalene
JournalZeitschrift für Kristallographie - Crystalline Materials
AuthorsResel, RolandAuthor
Pichler, AlexanderAuthor
Resel, RolandAuthor
Neuhold, AlfredAuthor
Dingemans, TheoAuthor
Schwabegger, GüntherAuthor
Simbrunner, ClemensAuthor
Moret, MassimoAuthor
Salzmann, IngoAuthor
Year2014 (January 1)Volume229
Issue5
PublisherWalter de Gruyter GmbH
DOIdoi:10.1515/zkri-2013-1704Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID117670Long-form Identifiermindat:1:5:117670:8
GUID0
Full ReferenceResel, Roland, Pichler, Alexander, Resel, Roland, Neuhold, Alfred, Dingemans, Theo, Schwabegger, Günther, Simbrunner, Clemens, Moret, Massimo, Salzmann, Ingo (2014) Crystal structure determination of organic thin-films: the example of 2,2′ :6′,2″-ternaphthalene. Zeitschrift für Kristallographie - Crystalline Materials, 229 (5) doi:10.1515/zkri-2013-1704
Plain TextResel, Roland, Pichler, Alexander, Resel, Roland, Neuhold, Alfred, Dingemans, Theo, Schwabegger, Günther, Simbrunner, Clemens, Moret, Massimo, Salzmann, Ingo (2014) Crystal structure determination of organic thin-films: the example of 2,2′ :6′,2″-ternaphthalene. Zeitschrift für Kristallographie - Crystalline Materials, 229 (5) doi:10.1515/zkri-2013-1704
In(2014, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 229 (5) Walter de Gruyter GmbH

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Schwabegger, Günther, Dingemans, Theo, Resel, Roland, Sitter, Helmut, Simbrunner, Clemens (2014) Non-doped, blue-emitting, color-stable, organic light-emitting diode based on 2,2′:6′,2″-ternaphthalene. Applied Physics A, 115. 731-735 doi:10.1007/s00339-014-8408-1
Resel, Roland, Bainschab, Markus, Pichler, Alexander, Dingemans, Theo, Simbrunner, Clemens, Stangl, Julian, Salzmann, Ingo (2016) Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films. Journal of Synchrotron Radiation, 23 (3). 729-734 doi:10.1107/s1600577516003672
Simbrunner, Clemens, Hernandez-Sosa, Gerardo, Oehzelt, Martin, Djuric, Tatjana, Salzmann, Ingo, Brinkmann, Martin, Schwabegger, Günther, Watzinger, Irene, Sitter, Helmut, Resel, Roland (2011) Epitaxial growth of sexithiophene on mica surfaces. Physical Review B, 83 (11) doi:10.1103/physrevb.83.115443
Simbrunner, Josef; Gasser, Fabian; John, Sanjay; Salzmann, Ingo; Resel, Roland (2025) Finding Crystal Orientations in Uniplanar Textures. Crystals, 15 (5). doi:10.3390/cryst15050443
Simbrunner, Josef, Simbrunner, Clemens, Schrode, Benedikt, Röthel, Christian, Bedoya-Martinez, Natalia, Salzmann, Ingo, Resel, Roland (2018) Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films. Acta Crystallographica Section A Foundations and Advances, 74 (4). 373-387 doi:10.1107/s2053273318006629
Neuschitzer, Markus, Moser, Armin, Neuhold, Alfred, Kraxner, Johanna, Stadlober, Barbara, Oehzelt, Martin, Salzmann, Ingo, Resel, Roland, Novák, Jiří (2012) Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. Journal of Applied Crystallography, 45 (2). 367-370 doi:10.1107/s0021889812000908
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Simbrunner, Josef, Salzmann, Ingo, Resel, Roland (2023) Indexing of grazing-incidence X-ray diffraction patterns. Crystallography Reviews, 29 (1) 19-37 doi:10.1080/0889311x.2023.2187051
Simbrunner, Josef, Resel, Roland, Salzmann, Ingo (2017) Indexation of grazing-incidence X-ray diffraction patterns. Acta Crystallographica Section A Foundations and Advances, 73. doi:10.1107/s2053273317086326
(2014) Pressure-supported crystal growth and single-crystal structure determination of Li2SiF6. Zeitschrift für Kristallographie – Crystalline Materials, 229 (2) doi:10.1515/zkri-2013-1622
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