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Fan, Ping, Zheng, Zhuang-Hao, Liang, Guang-Xing, Zhang, Dong-Ping, Cai, Xing-Min (2010) Thermoelectric characterization of ion beam sputtered Sb2Te3 thin films. Journal of Alloys and Compounds, 505. 278-280 doi:10.1016/j.jallcom.2010.06.046

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Reference TypeJournal (article/letter/editorial)
TitleThermoelectric characterization of ion beam sputtered Sb2Te3 thin films
JournalJournal of Alloys and Compounds
AuthorsFan, PingAuthor
Zheng, Zhuang-HaoAuthor
Liang, Guang-XingAuthor
Zhang, Dong-PingAuthor
Cai, Xing-MinAuthor
Year2010 (August)Volume505
PublisherElsevier BV
DOIdoi:10.1016/j.jallcom.2010.06.046Search in ResearchGate
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Mindat Ref. ID11896908Long-form Identifiermindat:1:5:11896908:8
GUID0
Full ReferenceFan, Ping, Zheng, Zhuang-Hao, Liang, Guang-Xing, Zhang, Dong-Ping, Cai, Xing-Min (2010) Thermoelectric characterization of ion beam sputtered Sb2Te3 thin films. Journal of Alloys and Compounds, 505. 278-280 doi:10.1016/j.jallcom.2010.06.046
Plain TextFan, Ping, Zheng, Zhuang-Hao, Liang, Guang-Xing, Zhang, Dong-Ping, Cai, Xing-Min (2010) Thermoelectric characterization of ion beam sputtered Sb2Te3 thin films. Journal of Alloys and Compounds, 505. 278-280 doi:10.1016/j.jallcom.2010.06.046
In(n.d.) Journal of Alloys and Compounds Vol. 505. Elsevier BV

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