Reference Type | Journal (article/letter/editorial) |
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Title | Fringe pattern analysis with a parametric method for measurement of absolute distance by a frequency-modulated continuous optical wave technique |
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Journal | Applied Optics |
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Authors | Mokdad, Rabah | Author |
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Pécheux, Bertrand | Author |
Pfeiffer, Pierre | Author |
Meyrueis, Patrick | Author |
Year | 2003 (February 20) | Volume | 42 |
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Publisher | The Optical Society |
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DOI | doi:10.1364/ao.42.001008Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 11963080 | Long-form Identifier | mindat:1:5:11963080:2 |
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GUID | 0 |
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Full Reference | Mokdad, Rabah, Pécheux, Bertrand, Pfeiffer, Pierre, Meyrueis, Patrick (2003) Fringe pattern analysis with a parametric method for measurement of absolute distance by a frequency-modulated continuous optical wave technique. Applied Optics, 42. 1008pp. doi:10.1364/ao.42.001008 |
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Plain Text | Mokdad, Rabah, Pécheux, Bertrand, Pfeiffer, Pierre, Meyrueis, Patrick (2003) Fringe pattern analysis with a parametric method for measurement of absolute distance by a frequency-modulated continuous optical wave technique. Applied Optics, 42. 1008pp. doi:10.1364/ao.42.001008 |
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In | (n.d.) Applied Optics Vol. 42. The Optical Society |
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