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Ke, Hong-Liang, Jing, Lei, Gao, Qun, Wang, Yao, Hao, Jian, Sun, Qiang, Xu, Zhi-Jun (2015) Comparison of online and offline tests in LED accelerated reliability tests under temperature stress. Applied Optics, 54. 9906pp. doi:10.1364/ao.54.009906

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Reference TypeJournal (article/letter/editorial)
TitleComparison of online and offline tests in LED accelerated reliability tests under temperature stress
JournalApplied Optics
AuthorsKe, Hong-LiangAuthor
Jing, LeiAuthor
Gao, QunAuthor
Wang, YaoAuthor
Hao, JianAuthor
Sun, QiangAuthor
Xu, Zhi-JunAuthor
Year2015 (November 20)Volume54
PublisherThe Optical Society
DOIdoi:10.1364/ao.54.009906Search in ResearchGate
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Mindat Ref. ID11976207Long-form Identifiermindat:1:5:11976207:7
GUID0
Full ReferenceKe, Hong-Liang, Jing, Lei, Gao, Qun, Wang, Yao, Hao, Jian, Sun, Qiang, Xu, Zhi-Jun (2015) Comparison of online and offline tests in LED accelerated reliability tests under temperature stress. Applied Optics, 54. 9906pp. doi:10.1364/ao.54.009906
Plain TextKe, Hong-Liang, Jing, Lei, Gao, Qun, Wang, Yao, Hao, Jian, Sun, Qiang, Xu, Zhi-Jun (2015) Comparison of online and offline tests in LED accelerated reliability tests under temperature stress. Applied Optics, 54. 9906pp. doi:10.1364/ao.54.009906
In(n.d.) Applied Optics Vol. 54. The Optical Society

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