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Fang, Yong Zheng, Jin, Min, He, Qing Bo, Shen, Hui, Jiang, Guo Jian, Xu, Jia Yue (2012) Crack Behavior of Si-Doped GaAs Crystals Grown by Pulling-Down Method. Key Engineering Materials, 531. 88-91 doi:10.4028/www.scientific.net/kem.531-532.88

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Reference TypeJournal (article/letter/editorial)
TitleCrack Behavior of Si-Doped GaAs Crystals Grown by Pulling-Down Method
JournalKey Engineering Materials
AuthorsFang, Yong ZhengAuthor
Jin, MinAuthor
He, Qing BoAuthor
Shen, HuiAuthor
Jiang, Guo JianAuthor
Xu, Jia YueAuthor
Year2012 (December)Volume531
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/kem.531-532.88Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID12014767Long-form Identifiermindat:1:5:12014767:2
GUID0
Full ReferenceFang, Yong Zheng, Jin, Min, He, Qing Bo, Shen, Hui, Jiang, Guo Jian, Xu, Jia Yue (2012) Crack Behavior of Si-Doped GaAs Crystals Grown by Pulling-Down Method. Key Engineering Materials, 531. 88-91 doi:10.4028/www.scientific.net/kem.531-532.88
Plain TextFang, Yong Zheng, Jin, Min, He, Qing Bo, Shen, Hui, Jiang, Guo Jian, Xu, Jia Yue (2012) Crack Behavior of Si-Doped GaAs Crystals Grown by Pulling-Down Method. Key Engineering Materials, 531. 88-91 doi:10.4028/www.scientific.net/kem.531-532.88
In(n.d.) Key Engineering Materials Vol. 531. Trans Tech Publications, Ltd.

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Jin, Min, Xu, Jia Yue, He, Qing Bo, Fang, Yong Zheng, Shen, Hui, Jiang, Guo Jian, Wang, Zhan Yong (2010) Defects of GaAs Crystals Grown by the Pulling-Down Method. Advanced Materials Research, 177. 219-222 doi:10.4028/www.scientific.net/amr.177.219
Jin, Min, Xu, Jia Yue, He, Qing Bo, Fang, Yong Zheng, Shen, Hui, Wang, Zhan Yong, Jiang, Guo Jian (2010) Growth of Undoped GaAs Single Crystal by Pulling-Down Method. Materials Science Forum, 663. 1213-1216 doi:10.4028/www.scientific.net/msf.663-665.1213
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