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Radousky, H. B., Armstrong, M. R., Goldman, N. (2021) Time resolved x-ray diffraction in shock compressed systems. Journal of Applied Physics, 129 (4) 40901pp. doi:10.1063/5.0034929

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Reference TypeJournal (article/letter/editorial)
TitleTime resolved x-ray diffraction in shock compressed systems
JournalJournal of Applied Physics
AuthorsRadousky, H. B.Author
Armstrong, M. R.Author
Goldman, N.Author
Year2021 (January 28)Volume129
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/5.0034929Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID13559619Long-form Identifiermindat:1:5:13559619:9
GUID0
Full ReferenceRadousky, H. B., Armstrong, M. R., Goldman, N. (2021) Time resolved x-ray diffraction in shock compressed systems. Journal of Applied Physics, 129 (4) 40901pp. doi:10.1063/5.0034929
Plain TextRadousky, H. B., Armstrong, M. R., Goldman, N. (2021) Time resolved x-ray diffraction in shock compressed systems. Journal of Applied Physics, 129 (4) 40901pp. doi:10.1063/5.0034929
In(2021, January) Journal of Applied Physics Vol. 129 (4) AIP Publishing

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Jensen, B. J., Gupta, Y. M. (2006) X-ray diffraction measurements in shock compressed magnesium doped LiF crystals. Journal of Applied Physics, 100 (5). 53512pp. doi:10.1063/1.2244524
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Liss, K.-D., dā€™Almeida, T., Kaiser, M., Hock, R., Magerl, A., Eloy, J. F. (2009) Time-resolved x-ray diffraction study of laser-induced shock and acoustic waves in single crystalline silicon. Journal of Applied Physics, 106 (4). 44914pp. doi:10.1063/1.3204968
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Holmes, N. C., Chau, R. (2003) Fast time-resolved spectroscopy in shock compressed matter. The Journal of Chemical Physics, 119 (6). 3316-3319 doi:10.1063/1.1589744
Turneaure, Stefan J., Gupta, Y. M. (2011) Material strength determination in the shock compressed state using x-ray diffraction measurements. Journal of Applied Physics, 109 (12). 123510pp. doi:10.1063/1.3597817
Liu, Q. C., Zhou, X. M. (2018) Time-resolved light emission ofa,c, andr-cut sapphires shock-compressed to 65 GPa. Journal of Applied Physics, 123 (13). 135902pp. doi:10.1063/1.5024412
Foster, J. M., Avraam, P. W., Floyd, E. K. R., Comley, A. J., Rothman, S. D., McGonegle, D. R., Graham, P., Peacock, L. J., Penman, R., Luis, J. J. D., Poulter, C. P. (2021) X-ray diffraction data from shock-compressed copper: Some consequences of metallurgical texture. Journal of Applied Physics, 129 (24) 245904pp. doi:10.1063/5.0053425
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