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Chang, Shyang-Jye, Huang, Chien-Yu (2021) Deep Learning Model for the Inspection of Coffee Bean Defects. Applied Sciences, 11 (17) 8226pp. doi:10.3390/app11178226

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Reference TypeJournal (article/letter/editorial)
TitleDeep Learning Model for the Inspection of Coffee Bean Defects
JournalApplied Sciences
AuthorsChang, Shyang-JyeAuthor
Huang, Chien-YuAuthor
Year2021 (September 4)Volume11
Issue17
PublisherMDPI AG
DOIdoi:10.3390/app11178226Search in ResearchGate
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Mindat Ref. ID13882615Long-form Identifiermindat:1:5:13882615:6
GUID0
Full ReferenceChang, Shyang-Jye, Huang, Chien-Yu (2021) Deep Learning Model for the Inspection of Coffee Bean Defects. Applied Sciences, 11 (17) 8226pp. doi:10.3390/app11178226
Plain TextChang, Shyang-Jye, Huang, Chien-Yu (2021) Deep Learning Model for the Inspection of Coffee Bean Defects. Applied Sciences, 11 (17) 8226pp. doi:10.3390/app11178226
In(2021, September) Applied Sciences Vol. 11 (17) MDPI AG

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