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Erbil, A., Cargill III, G. S., Frahm, R., Boehme, R. F. (1988) Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure. Physical Review B, 37 (5) 2450-2464 doi:10.1103/physrevb.37.2450

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Reference TypeJournal (article/letter/editorial)
TitleTotal-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
JournalPhysical Review B
AuthorsErbil, A.Author
Cargill III, G. S.Author
Frahm, R.Author
Boehme, R. F.Author
Year1988 (February 15)Volume37
Issue5
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.37.2450Search in ResearchGate
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Mindat Ref. ID14098807Long-form Identifiermindat:1:5:14098807:1
GUID0
Full ReferenceErbil, A., Cargill III, G. S., Frahm, R., Boehme, R. F. (1988) Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure. Physical Review B, 37 (5) 2450-2464 doi:10.1103/physrevb.37.2450
Plain TextErbil, A., Cargill III, G. S., Frahm, R., Boehme, R. F. (1988) Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure. Physical Review B, 37 (5) 2450-2464 doi:10.1103/physrevb.37.2450
In(1988, February) Physical Review B Vol. 37 (5) American Physical Society (APS)

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Boehme, R. F., Cargill III, G. S., Weber, W., Jackson, T. (1985) Diode current detection of extended x‐ray absorption fine structure in gallium arsenide. Journal of Applied Physics, 58 (2). 811-815 doi:10.1063/1.336149
Erbil, A., Weber, W., Cargill, G. S., Boehme, R. F. (1986) Lattice distortions for arsenic in single-crystal silicon. Physical Review B, 34 (2) 1392-1394 doi:10.1103/physrevb.34.1392
Kordesch, M. E., Hoffman, R. W. (1984) Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detector. Physical Review B, 29 (1) 491-492 doi:10.1103/physrevb.29.491
Elam, W. T., Kirkland, J. P., Neiser, R. A., Wolf, P. D. (1988) Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum. Physical Review B, 38 (1) 26-30 doi:10.1103/physrevb.38.26
Arvanitis, D., Baberschke, K., Wenzel, L. (1988) Multiple-scattering effects in surface extended x-ray absorption fine structure. Physical Review B, 37 (12) 7143-7146 doi:10.1103/physrevb.37.7143
Bouldin, C., Forman, R., Bell, M. (1987) Conversion-electron extended x-ray-absorption fine-structure measurements of ion-damaged GaAs. Physical Review B, 35 (3) 1429-1432 doi:10.1103/physrevb.35.1429
Houser, B., Alberding, N., Ingalls, R., Crozier, E. D. (1988) High-pressure study ofα-quartzGeO2using extended x-ray-absorption fine structure. Physical Review B, 37 (11) 6513-6516 doi:10.1103/physrevb.37.6513
Faraci, G., Pennisi, A. R., Terrasi, A., Mobilio, S. (1988) Xe bubbles in si observed by extended x-ray-absorption fine-structure spectroscopy. Physical Review B, 38 (18) 13468-13471 doi:10.1103/physrevb.38.13468
Guo, Tie, denBoer, M. L. (1985) Extended x-ray-absorption fine structure: Direct comparison of absorption and electron yield. Physical Review B, 31 (10) 6233-6237 doi:10.1103/physrevb.31.6233
Fornasini, P., a Beccara, S., Dalba, G., Grisenti, R., Sanson, A., Vaccari, M., Rocca, F. (2004) Extended x-ray-absorption fine-structure measurements of copper:  Local dynamics, anharmonicity, and thermal expansion. Physical Review B, 70 (17) doi:10.1103/physrevb.70.174301
Lu, Dan, Rehr, J. J. (1988) Inelastic processes in extended x-ray-absorption fine structure. Physical Review B, 37 (11) 6126-6133 doi:10.1103/physrevb.37.6126
 
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