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Hosono, Hideo, Abe, Yoshihiro, Oyoshi, Keiji, Tanaka, Shuhei (1991) Effects of coimplantation of silicon and nitrogen on structural defects and Si-N bond formation in silica glass. Physical Review B, 43 (14) 11966-11970 doi:10.1103/physrevb.43.11966

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Reference TypeJournal (article/letter/editorial)
TitleEffects of coimplantation of silicon and nitrogen on structural defects and Si-N bond formation in silica glass
JournalPhysical Review B
AuthorsHosono, HideoAuthor
Abe, YoshihiroAuthor
Oyoshi, KeijiAuthor
Tanaka, ShuheiAuthor
Year1991 (May 15)Volume43
Issue14
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.43.11966Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14109384Long-form Identifiermindat:1:5:14109384:2
GUID0
Full ReferenceHosono, Hideo, Abe, Yoshihiro, Oyoshi, Keiji, Tanaka, Shuhei (1991) Effects of coimplantation of silicon and nitrogen on structural defects and Si-N bond formation in silica glass. Physical Review B, 43 (14) 11966-11970 doi:10.1103/physrevb.43.11966
Plain TextHosono, Hideo, Abe, Yoshihiro, Oyoshi, Keiji, Tanaka, Shuhei (1991) Effects of coimplantation of silicon and nitrogen on structural defects and Si-N bond formation in silica glass. Physical Review B, 43 (14) 11966-11970 doi:10.1103/physrevb.43.11966
In(1991, May) Physical Review B Vol. 43 (14) American Physical Society (APS)

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Hosono, Hideo, Suzuki, Yukihito, Abe, Yoshihiro, Oyoshi, Keiji, Tanaka, Shuhei (1992) Formation of nanoscale phosphorus colloids in implanted SiO2 glass. Journal of Non-Crystalline Solids, 142. 287-290 doi:10.1016/s0022-3093(05)80035-3
Imai, Hiroaki, Arai, Kazuo, Hosono, Hideo, Abe, Yoshihiro, Arai, Takehiko, Imagawa, Hiroshi (1991) Dependence of defects induced by excimer laser on intrinsic structural defects in synthetic silica glasses. Physical Review B, 44 (10) 4812-4818 doi:10.1103/physrevb.44.4812
Imai, Hiroaki, Arai, Kazuo, Imagawa, Hiroshi, Hosono, Hideo, Abe, Yoshihiro (1988) Two types of oxygen-deficient centers in synthetic silica glass. Physical Review B, 38 (17) 12772-12775 doi:10.1103/physrevb.38.12772
Oyoshi, Keiji, Tagami, Takashi, Tanaka, Shuhei (1991) Smoothing of Silica Glass Surfaces by Ion Implantation. Japanese Journal of Applied Physics, 30. 1854-1859 doi:10.1143/jjap.30.1854
Hosono, Hideo, Weeks, Robert A. (1990) Erratum: Structural defects in chromium-ion-implanted vitreous silica. Physical Review B, 42 (8) 5361 doi:10.1103/physrevb.42.5361
Hosono, Hideo, Weeks, Robert A. (1989) Structural defects in chromium-ion-implanted vitreous silica. Physical Review B, 40 (15) 10543-10549 doi:10.1103/physrevb.40.10543
Hosono, Hideo, Kawazoe, Hiroshi, Oyoshi, Keiji, Tanaka, Shuhei (1994) Paramagnetic resonance of Eā€²-type centers in Si-implanted amorphous SiO2. Si29 hyperfine structure and characteristics of Zeeman resonances. Journal of Non-Crystalline Solids, 179. 39-50 doi:10.1016/0022-3093(94)90683-1
Keiji, Oyoshi, Takashi, Tagami, Ken, Yamashita, Shuhei, Tanaka (1991) Formation of phosphosilicate glass layers in glasses by ion implantation. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 59. 1324-1327 doi:10.1016/0168-583x(91)95822-u
Oyoshi, Keiji, Yamaoka, Tomonori, Tagami, Takashi, Arima, Yasunori, Tanaka, Shuhei (1992) Grainā€size distribution in ionā€irradiated amorphous Si films on glass substrates. Journal of Applied Physics, 71 (2). 648-652 doi:10.1063/1.351349
Abe, Yoshihiro, Hosono, Hideo, Ohta, Yoshio, Hench, L. L. (1988) Protonic conduction in oxide glasses: simple relations between electrical conductivity, activation energy, and the o-h bonding state. Physical Review B, 38 (14) 10166-10169 doi:10.1103/physrevb.38.10166
Abe, Yoshihiro, Hosono, Hideo, Lee, Won-Hyuk, Kasuga, Toshihiro (1993) Electrical conduction due to protons and alkali-metal ions in oxide glasses. Physical Review B, 48 (21) 15621-15625 doi:10.1103/physrevb.48.15621
 
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