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Tartakovskii, A. I., Makhonin, M. N., Sellers, I. R., Cahill, J., Andreev, A. D., Whittaker, D. M., Wells, J-P. R., Fox, A. M., Mowbray, D. J., Skolnick, M. S., Groom, K. M., Steer, M. J., Liu, H. Y., Hopkinson, M. (2004) Effect of thermal annealing and strain engineering on the fine structure of quantum dot excitons. Physical Review B, 70 (19) doi:10.1103/physrevb.70.193303

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Reference TypeJournal (article/letter/editorial)
TitleEffect of thermal annealing and strain engineering on the fine structure of quantum dot excitons
JournalPhysical Review B
AuthorsTartakovskii, A. I.Author
Makhonin, M. N.Author
Sellers, I. R.Author
Cahill, J.Author
Andreev, A. D.Author
Whittaker, D. M.Author
Wells, J-P. R.Author
Fox, A. M.Author
Mowbray, D. J.Author
Skolnick, M. S.Author
Groom, K. M.Author
Steer, M. J.Author
Liu, H. Y.Author
Hopkinson, M.Author
Year2004 (November 5)Volume70
Issue19
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.70.193303Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14174343Long-form Identifiermindat:1:5:14174343:3
GUID0
Full ReferenceTartakovskii, A. I., Makhonin, M. N., Sellers, I. R., Cahill, J., Andreev, A. D., Whittaker, D. M., Wells, J-P. R., Fox, A. M., Mowbray, D. J., Skolnick, M. S., Groom, K. M., Steer, M. J., Liu, H. Y., Hopkinson, M. (2004) Effect of thermal annealing and strain engineering on the fine structure of quantum dot excitons. Physical Review B, 70 (19) doi:10.1103/physrevb.70.193303
Plain TextTartakovskii, A. I., Makhonin, M. N., Sellers, I. R., Cahill, J., Andreev, A. D., Whittaker, D. M., Wells, J-P. R., Fox, A. M., Mowbray, D. J., Skolnick, M. S., Groom, K. M., Steer, M. J., Liu, H. Y., Hopkinson, M. (2004) Effect of thermal annealing and strain engineering on the fine structure of quantum dot excitons. Physical Review B, 70 (19) doi:10.1103/physrevb.70.193303
In(2004, November) Physical Review B Vol. 70 (19) American Physical Society (APS)

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