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Papadimitriou, D., Richter, W. (2005) Highly sensitive strain detection in silicon by reflectance anisotropy spectroscopy. Physical Review B, 72 (7) doi:10.1103/physrevb.72.075212

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Reference TypeJournal (article/letter/editorial)
TitleHighly sensitive strain detection in silicon by reflectance anisotropy spectroscopy
JournalPhysical Review B
AuthorsPapadimitriou, D.Author
Richter, W.Author
Year2005 (August 29)Volume72
Issue7
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.72.075212Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14181821Long-form Identifiermindat:1:5:14181821:6
GUID0
Full ReferencePapadimitriou, D., Richter, W. (2005) Highly sensitive strain detection in silicon by reflectance anisotropy spectroscopy. Physical Review B, 72 (7) doi:10.1103/physrevb.72.075212
Plain TextPapadimitriou, D., Richter, W. (2005) Highly sensitive strain detection in silicon by reflectance anisotropy spectroscopy. Physical Review B, 72 (7) doi:10.1103/physrevb.72.075212
In(2005, August) Physical Review B Vol. 72 (7) American Physical Society (APS)

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