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Takeda, Y., Arita, M., Higashiguchi, M., Shimada, K., Namatame, H., Taniguchi, M., Iga, F., Takabatake, T. (2006) High-resolution photoemission study of the temperature-dependentc−fhybridization gap in the Kondo semiconductorYbB12. Physical Review B, 73 (3) doi:10.1103/physrevb.73.033202

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Reference TypeJournal (article/letter/editorial)
TitleHigh-resolution photoemission study of the temperature-dependentc−fhybridization gap in the Kondo semiconductorYbB12
JournalPhysical Review B
AuthorsTakeda, Y.Author
Arita, M.Author
Higashiguchi, M.Author
Shimada, K.Author
Namatame, H.Author
Taniguchi, M.Author
Iga, F.Author
Takabatake, T.Author
Year2006 (January 24)Volume73
Issue3
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.73.033202Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14184420Long-form Identifiermindat:1:5:14184420:8
GUID0
Full ReferenceTakeda, Y., Arita, M., Higashiguchi, M., Shimada, K., Namatame, H., Taniguchi, M., Iga, F., Takabatake, T. (2006) High-resolution photoemission study of the temperature-dependentc−fhybridization gap in the Kondo semiconductorYbB12. Physical Review B, 73 (3) doi:10.1103/physrevb.73.033202
Plain TextTakeda, Y., Arita, M., Higashiguchi, M., Shimada, K., Namatame, H., Taniguchi, M., Iga, F., Takabatake, T. (2006) High-resolution photoemission study of the temperature-dependentc−fhybridization gap in the Kondo semiconductorYbB12. Physical Review B, 73 (3) doi:10.1103/physrevb.73.033202
In(2006, January) Physical Review B Vol. 73 (3) American Physical Society (APS)


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