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Holý, Vaclav, Stangl, Julian, Fromherz, Thomas, Lechner, Rainer T., Wintersberger, Eugene, Bauer, Günther, Dais, Christian, Müller, Elisabeth, Grützmacher, Detlev (2009) X-ray diffraction investigation of a three-dimensional Si/SiGe quantum dot crystal. Physical Review B, 79 (3) doi:10.1103/physrevb.79.035324

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Reference TypeJournal (article/letter/editorial)
TitleX-ray diffraction investigation of a three-dimensional Si/SiGe quantum dot crystal
JournalPhysical Review B
AuthorsHolý, VaclavAuthor
Stangl, JulianAuthor
Fromherz, ThomasAuthor
Lechner, Rainer T.Author
Wintersberger, EugeneAuthor
Bauer, GüntherAuthor
Dais, ChristianAuthor
Müller, ElisabethAuthor
Grützmacher, DetlevAuthor
Year2009 (January 26)Volume79
Issue3
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.79.035324Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14202374Long-form Identifiermindat:1:5:14202374:9
GUID0
Full ReferenceHolý, Vaclav, Stangl, Julian, Fromherz, Thomas, Lechner, Rainer T., Wintersberger, Eugene, Bauer, Günther, Dais, Christian, Müller, Elisabeth, Grützmacher, Detlev (2009) X-ray diffraction investigation of a three-dimensional Si/SiGe quantum dot crystal. Physical Review B, 79 (3) doi:10.1103/physrevb.79.035324
Plain TextHolý, Vaclav, Stangl, Julian, Fromherz, Thomas, Lechner, Rainer T., Wintersberger, Eugene, Bauer, Günther, Dais, Christian, Müller, Elisabeth, Grützmacher, Detlev (2009) X-ray diffraction investigation of a three-dimensional Si/SiGe quantum dot crystal. Physical Review B, 79 (3) doi:10.1103/physrevb.79.035324
In(2009, January) Physical Review B Vol. 79 (3) American Physical Society (APS)

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FROMHERZ, T., STANGL, J., LECHNER, R. T., WINTERSBERGER, E., BAUER, G., HOLY, V., DAIS, C., MÜLLER, E., SIGG, H., Solak, H. H., GRÜTZMACHER, D. (2009) 3D SiGe QUANTUM DOT CRYSTALS: STRUCTURAL CHARACTERIZATION AND ELECTRONIC COUPLING. International Journal of Modern Physics B, 23 (12). 2836-2841 doi:10.1142/s0217979209062414
Roch, T., Holý, V., Hesse, A., Stangl, J., Fromherz, T., Bauer, G., Metzger, T. H., Ferrer, S. (2002) Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction. Physical Review B, 65 (24) doi:10.1103/physrevb.65.245324
Novák, J., Holý, V., Stangl, J., Fromherz, T., Zhong, Zhenyang, Chen, Gang, Bauer, G., Struth, B. (2005) Ge∕Si islands in a three-dimensional island crystal studied by x-ray diffraction. Journal of Applied Physics, 98 (7). 73517pp. doi:10.1063/1.2073974
Schülli, T. U., Stoffel, M., Hesse, A., Stangl, J., Lechner, R. T., Wintersberger, E., Sztucki, M., Metzger, T. H., Schmidt, O. G., Bauer, G. (2005) Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping. Physical Review B, 71 (3) doi:10.1103/physrevb.71.035326
Holý, V., Darhuber, A. A., Stangl, J., Zerlauth, S., Schäffler, F., Bauer, G., Darowski, N., Lübbert, D., Pietsch, U., Vávra, I. (1998) Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers. Physical Review B, 58 (12) 7934-7943 doi:10.1103/physrevb.58.7934
Lechner, R. T., Schülli, T. U., Holý, V., Springholz, G., Stangl, J., Raab, A., Bauer, G., Metzger, T. H. (2004) Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction. Applied Physics Letters, 84 (6). 885-887 doi:10.1063/1.1644627
Grützmacher, Detlev, Dais, Christian, Zhang, Li, Müller, Elisabeth, Solak, Harun H. (2007) Templated self-organization of SiGe quantum structures for nanoelectronics. Materials Science and Engineering: C, 27. 947-953 doi:10.1016/j.msec.2006.07.029
Meduňa, Mojmír, Novák, Jiří, Bauer, Günther, Holý, Václav, Falub, Claudiu Valentin, Tsujino, Soichiro, Müller, Elisabeth, Grützmacher, Detlev, Campidelli, Yves, Kermarrec, Olivier, Bensahel, Daniel (2004) Annealing studies of high Ge composition Si/SiGe multilayers. Zeitschrift für Kristallographie - Crystalline Materials, 219 (4) doi:10.1524/zkri.219.4.195.30440
Dais, Christian, Solak, Harun H., Ekinci, Yasin, Müller, Elisabeth, Sigg, Hans, Grützmacher, Detlev (2007) Ge quantum dot molecules and crystals: Preparation and properties. Surface Science, 601 (13). 2787-2791 doi:10.1016/j.susc.2006.12.053
Stangl, J., Holý, V., Roch, T., Daniel, A., Bauer, G., Zhu, J., Brunner, K., Abstreiter, G. (2000) Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice. Physical Review B, 62 (11) 7229-7236 doi:10.1103/physrevb.62.7229
Roch, T., Medun̆a, M., Stangl, J., Hesse, A., Lechner, R. T., Bauer, G., Dehlinger, G., Diehl, L., Gennser, U., Müller, E., Grützmacher, D. (2002) Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics, 91 (11). 8974-8978 doi:10.1063/1.1473674
 
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