Sakko, A., Sternemann, C., Sahle, Ch. J., Sternemann, H., Feroughi, O. M., Conrad, H., Djurabekova, F., Hohl, A., Seidler, G. T., Tolan, M., Hämäläinen, K. (2010) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering. Physical Review B, 81 (20) doi:10.1103/physrevb.81.205317
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering | ||
| Journal | Physical Review B | ||
| Authors | Sakko, A. | Author | |
| Sternemann, C. | Author | ||
| Sahle, Ch. J. | Author | ||
| Sternemann, H. | Author | ||
| Feroughi, O. M. | Author | ||
| Conrad, H. | Author | ||
| Djurabekova, F. | Author | ||
| Hohl, A. | Author | ||
| Seidler, G. T. | Author | ||
| Tolan, M. | Author | ||
| Hämäläinen, K. | Author | ||
| Year | 2010 (May 21) | Volume | 81 |
| Issue | 20 | ||
| Publisher | American Physical Society (APS) | ||
| DOI | doi:10.1103/physrevb.81.205317Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 14207603 | Long-form Identifier | mindat:1:5:14207603:5 |
| GUID | 0 | ||
| Full Reference | Sakko, A., Sternemann, C., Sahle, Ch. J., Sternemann, H., Feroughi, O. M., Conrad, H., Djurabekova, F., Hohl, A., Seidler, G. T., Tolan, M., Hämäläinen, K. (2010) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering. Physical Review B, 81 (20) doi:10.1103/physrevb.81.205317 | ||
| Plain Text | Sakko, A., Sternemann, C., Sahle, Ch. J., Sternemann, H., Feroughi, O. M., Conrad, H., Djurabekova, F., Hohl, A., Seidler, G. T., Tolan, M., Hämäläinen, K. (2010) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering. Physical Review B, 81 (20) doi:10.1103/physrevb.81.205317 | ||
| In | (2010, May) Physical Review B Vol. 81 (20) American Physical Society (APS) | ||
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