Magnuson, Martin, Schmidt, Susann, Hultman, Lars, Högberg, Hans (2017) Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy. Physical Review B, 96 (19) doi:10.1103/physrevb.96.195103
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy | ||
Journal | Physical Review B | ||
Authors | Magnuson, Martin | Author | |
Schmidt, Susann | Author | ||
Hultman, Lars | Author | ||
Högberg, Hans | Author | ||
Year | 2017 (November 1) | Volume | 96 |
Issue | 19 | ||
Publisher | American Physical Society (APS) | ||
DOI | doi:10.1103/physrevb.96.195103Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14248822 | Long-form Identifier | mindat:1:5:14248822:7 |
GUID | 0 | ||
Full Reference | Magnuson, Martin, Schmidt, Susann, Hultman, Lars, Högberg, Hans (2017) Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy. Physical Review B, 96 (19) doi:10.1103/physrevb.96.195103 | ||
Plain Text | Magnuson, Martin, Schmidt, Susann, Hultman, Lars, Högberg, Hans (2017) Electronic properties and bonding in ZrHx thin films investigated by valence-band x-ray photoelectron spectroscopy. Physical Review B, 96 (19) doi:10.1103/physrevb.96.195103 | ||
In | (2017, November) Physical Review B Vol. 96 (19) American Physical Society (APS) |
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