Abe, Takao, Maruyama, Shigeru (1966) Observations of Defects in Silicon Single Crystals. Japanese Journal of Applied Physics, 5 (10) 979-980 doi:10.1143/jjap.5.979
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Observations of Defects in Silicon Single Crystals | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Abe, Takao | Author | |
Maruyama, Shigeru | Author | ||
Year | 1966 (October) | Volume | 5 |
Issue | 10 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.5.979Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14976401 | Long-form Identifier | mindat:1:5:14976401:0 |
GUID | 0 | ||
Full Reference | Abe, Takao, Maruyama, Shigeru (1966) Observations of Defects in Silicon Single Crystals. Japanese Journal of Applied Physics, 5 (10) 979-980 doi:10.1143/jjap.5.979 | ||
Plain Text | Abe, Takao, Maruyama, Shigeru (1966) Observations of Defects in Silicon Single Crystals. Japanese Journal of Applied Physics, 5 (10) 979-980 doi:10.1143/jjap.5.979 | ||
In | (1966, October) Japanese Journal of Applied Physics Vol. 5 (10) Japan Society of Applied Physics |
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