Reference Type | Journal (article/letter/editorial) |
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Title | Properties of Intersurface in Au-Insulator-CdS Measured by Capacitance Method |
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Journal | Japanese Journal of Applied Physics |
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Authors | Okazaki, Susumu | Author |
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Otaki, Eiji | Author |
Year | 1966 (February) | Volume | 5 |
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Issue | 2 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.5.181Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14976481 | Long-form Identifier | mindat:1:5:14976481:2 |
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GUID | 0 |
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Full Reference | Okazaki, Susumu, Otaki, Eiji (1966) Properties of Intersurface in Au-Insulator-CdS Measured by Capacitance Method. Japanese Journal of Applied Physics, 5 (2) 181-182 doi:10.1143/jjap.5.181 |
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Plain Text | Okazaki, Susumu, Otaki, Eiji (1966) Properties of Intersurface in Au-Insulator-CdS Measured by Capacitance Method. Japanese Journal of Applied Physics, 5 (2) 181-182 doi:10.1143/jjap.5.181 |
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In | (1966, February) Japanese Journal of Applied Physics Vol. 5 (2) Japan Society of Applied Physics |
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