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Koizumi, Hideo (1966) An X-Ray Study on PbO-Nb2O5-TiO2System. Japanese Journal of Applied Physics, 5 (3) 198-202 doi:10.1143/jjap.5.198

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Reference TypeJournal (article/letter/editorial)
TitleAn X-Ray Study on PbO-Nb2O5-TiO2System
JournalJapanese Journal of Applied Physics
AuthorsKoizumi, HideoAuthor
Year1966 (March)Volume5
Issue3
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.5.198Search in ResearchGate
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Mindat Ref. ID14976494Long-form Identifiermindat:1:5:14976494:2
GUID0
Full ReferenceKoizumi, Hideo (1966) An X-Ray Study on PbO-Nb2O5-TiO2System. Japanese Journal of Applied Physics, 5 (3) 198-202 doi:10.1143/jjap.5.198
Plain TextKoizumi, Hideo (1966) An X-Ray Study on PbO-Nb2O5-TiO2System. Japanese Journal of Applied Physics, 5 (3) 198-202 doi:10.1143/jjap.5.198
In(1966, March) Japanese Journal of Applied Physics Vol. 5 (3) Japan Society of Applied Physics

See Also

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Koizumi, Hideo, Niizeki, Nobukazu, Ikeda, Takuro (1964) An X-Ray Study on Bi2O3-Fe2O3System. Japanese Journal of Applied Physics, 3 (8) 495-496 doi:10.1143/jjap.3.495
Mihama, Kazuhiro (1966) The Fffects of Ion Bombardment on Molybdenite. Japanese Journal of Applied Physics, 5 (3) 202-207 doi:10.1143/jjap.5.202
Tanemura, Takashi (1966) Performance of an X-Ray Spectroanalyzer Using Pm147Beta-Ray Source. Japanese Journal of Applied Physics, 5 (1) 51-58 doi:10.1143/jjap.5.51
Okamoto, Hideo (1966) Further Note on Crystallites in Obliquely Evaporated Film of CdS. Japanese Journal of Applied Physics, 5 (3) 251 doi:10.1143/jjap.5.251
Ichinokawa, Takeo (1966) X-Ray Microdiffraction with a Scanning X-Ray Microanalyzer. Japanese Journal of Applied Physics, 5 (9) 796-806 doi:10.1143/jjap.5.796
Munakata, Chusuke, Todokoro, Hideo (1966) A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium. Japanese Journal of Applied Physics, 5 (3) 249 doi:10.1143/jjap.5.249
Okamoto, Hideo (1966) Crystallites in Evaporated Film of CdS on Au and Al Films. Japanese Journal of Applied Physics, 5 (2) 177 doi:10.1143/jjap.5.177
Ohki, Shigehisa, Yoshihara, Hideo (1990) High-Precision X-Ray Mask Technology. Japanese Journal of Applied Physics, 29. 2600-2604 doi:10.1143/jjap.29.2600
Katada, Kinya (1966) An Electron Diffraction Study Evaporated Boron Films. Japanese Journal of Applied Physics, 5 (7) 582-587 doi:10.1143/jjap.5.582
Ichinokawa, Takeo (1966) Observation of Crystal Defects by Pseudo-Kossel Lines on X-Ray Projection Micrograph. Japanese Journal of Applied Physics, 5 (1) 36-38 doi:10.1143/jjap.5.36
Shiraiwa, Toshio, Fujino, Nobukatsu (1966) Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis. Japanese Journal of Applied Physics, 5 (10) 886-899 doi:10.1143/jjap.5.886
 
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