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Watanabe, Hiroshi, Ishikawa, Isao (1967) A Liquid Helium Cooled Stage for an Electron Microscope. Japanese Journal of Applied Physics, 6 (1) 83-88 doi:10.1143/jjap.6.83

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Reference TypeJournal (article/letter/editorial)
TitleA Liquid Helium Cooled Stage for an Electron Microscope
JournalJapanese Journal of Applied Physics
AuthorsWatanabe, HiroshiAuthor
Ishikawa, IsaoAuthor
Year1967 (January)Volume6
Issue1
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.6.83Search in ResearchGate
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Mindat Ref. ID14976693Long-form Identifiermindat:1:5:14976693:9
GUID0
Full ReferenceWatanabe, Hiroshi, Ishikawa, Isao (1967) A Liquid Helium Cooled Stage for an Electron Microscope. Japanese Journal of Applied Physics, 6 (1) 83-88 doi:10.1143/jjap.6.83
Plain TextWatanabe, Hiroshi, Ishikawa, Isao (1967) A Liquid Helium Cooled Stage for an Electron Microscope. Japanese Journal of Applied Physics, 6 (1) 83-88 doi:10.1143/jjap.6.83
In(1967, January) Japanese Journal of Applied Physics Vol. 6 (1) Japan Society of Applied Physics

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Watanabe, Hiroshi (1967) The Effect of Amorphous Surface Layers on Electron Microscope Images of Crystals. Japanese Journal of Applied Physics, 6 (7) 808-814 doi:10.1143/jjap.6.808
Murooka, Seiichi, Fujiki, Hideo (1991) A Side-Entry Helium-Cooled Stage for Electron Microscopy. Japanese Journal of Applied Physics, 30. 411-413 doi:10.1143/jjap.30.411
Fujita, Hiroshi, Komatsu, Masao, Ishikawa, Isao (1976) A Universal Environmental Cell for a 3MV-Class Electron Microscope and Its Applications to Metallurgical Subjects. Japanese Journal of Applied Physics, 15 (11) 2221-2228 doi:10.1143/jjap.15.2221
Nagata, Fumio, Ishikawa, Isao (1972) Observation of Wet Biological Materials in a High Voltage Electron Microscope. Japanese Journal of Applied Physics, 11 (9) 1239-1244 doi:10.1143/jjap.11.1239
Watanabe, Hiroshi (1964) Energy Selecting Microscope. Japanese Journal of Applied Physics, 3 (8) 480-485 doi:10.1143/jjap.3.480
Kimoto, Kazuo, Nishida, Isao (1967) An Electron Microscope and Electron Diffraction Study of Fine Smoke Particles Prepared by Evaporation in Argon Gas at Low Pressures (II) Japanese Journal of Applied Physics, 6 (9) 1047-1059 doi:10.1143/jjap.6.1047
Venables, J. A. (1963) Liquid Helium Cooled Tilting Stage for an Electron Microscope. Review of Scientific Instruments, 34 (5). 582-583 doi:10.1063/1.1718509
Fujita, Hiroshi, Kawasaki, Yōzō, Furubayashi, Ei-ichi, Kajiwara, Setuo, Taoka, Tadami (1967) Metallurgical Investigations with a 500 kV Electron Microscope. Japanese Journal of Applied Physics, 6 (2) 214-230 doi:10.1143/jjap.6.214
Ueda, Osamu, Ishikawa, Hiroshi, Umebu, Itsuo (1984) Transmission Electron Microscope Study of Defects in Cd-Diffused n-InP Substrates. Japanese Journal of Applied Physics, 23. 1551-1554 doi:10.1143/jjap.23.1551
Nohara, Akira, Yukawa, Natsuo, Yokoi, Masayoshi, Ishikawa, Isao, Imura, Toru (1975) Stress-Strain Measurable High-Temperature Tensile Test Device for Use with Electron Microscope. Japanese Journal of Applied Physics, 14 (11) 1829-1830 doi:10.1143/jjap.14.1829
Takeuchi, Tomoyuki, Ikeda, Shozo, Ikeno, Susumu, Furubayashi, Ei-ichi (1973) A Specimen Stage for Low Temperature Tensile Deformation in an Electron Microscope. Japanese Journal of Applied Physics, 12 (1) 142-145 doi:10.1143/jjap.12.142
 
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