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Ishikawa, Kazuo, Goto, Keisuke (1967) Secondary Electron Emission from Diffusion Pump Oils. I. Japanese Journal of Applied Physics, 6 (11) 1329-1335 doi:10.1143/jjap.6.1329

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Reference TypeJournal (article/letter/editorial)
TitleSecondary Electron Emission from Diffusion Pump Oils. I
JournalJapanese Journal of Applied Physics
AuthorsIshikawa, KazuoAuthor
Goto, KeisukeAuthor
Year1967 (November)Volume6
Issue11
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.6.1329Search in ResearchGate
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Mindat Ref. ID14976732Long-form Identifiermindat:1:5:14976732:5
GUID0
Full ReferenceIshikawa, Kazuo, Goto, Keisuke (1967) Secondary Electron Emission from Diffusion Pump Oils. I. Japanese Journal of Applied Physics, 6 (11) 1329-1335 doi:10.1143/jjap.6.1329
Plain TextIshikawa, Kazuo, Goto, Keisuke (1967) Secondary Electron Emission from Diffusion Pump Oils. I. Japanese Journal of Applied Physics, 6 (11) 1329-1335 doi:10.1143/jjap.6.1329
In(1967, November) Japanese Journal of Applied Physics Vol. 6 (11) Japan Society of Applied Physics

See Also

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Goto, Keisuke, Ishikawa, Kazuo (1968) Secondary Electron Emission from Diffusion Pump Oils II. δ-η Analysis for DC-705. Japanese Journal of Applied Physics, 7 (3) 227-231 doi:10.1143/jjap.7.227
Goto, Keisuke, Ishikawa, Kazuo (1970) Secondary Electron Emission from DC-704 and Octoil-S. Japanese Journal of Applied Physics, 9 (5) 587-588 doi:10.1143/jjap.9.587
Goto, Keisuke, Ishikawa, Kazuo (1973) Fine structures and energy distribution of secondary electron emission from Si(111). Journal of Applied Physics, 44 (1). 132-137 doi:10.1063/1.1661847
Ishikawa, Kazuo, Hamasaki, Sei-ichi, Goto, Keisuke (1983) Improvement of Depth Resolution in Sputter Profiling by Cooling Specimens. Japanese Journal of Applied Physics, 22. doi:10.1143/jjap.22.l547
Goto, Keisuke, Ishikawa, Kazuo (1972) Method for Detecting Fine Structure in the Secondary Electron Emission Yield and the Application to Si(111). Journal of Applied Physics, 43 (4). 1559-1562 doi:10.1063/1.1661361
Kawasaki, Sunao, Huke, Kazuo (1967) Electron Beam Extraction from INS AG Synchrotron. Part I. Theory. Japanese Journal of Applied Physics, 6 (2) 231-241 doi:10.1143/jjap.6.231
Goto, Keisuke, Koshikawa, Takanori, Shimizu, Ryuichi, Ishikawa, Kazuo (1974) Auger and Secondary Electrons Excited by Backscattered Electrons. Japanese Journal of Applied Physics, 13. 633 doi:10.7567/jjaps.2s2.633
Grais, Khairi I., Bastawros, A. M. (1980) Field Enhanced Secondary Electron Emission from MgO and NaCl. Japanese Journal of Applied Physics, 19 (11) 2089-2093 doi:10.1143/jjap.19.2089
Ishikawa, Kazuo, Tanemura, Masaki (1984) Surface Diffusion of Sulfur on Oxygen-Covered Tungsten Studied by Auger Electron Spectroscopy. Japanese Journal of Applied Physics, 23. 842-845 doi:10.1143/jjap.23.842
Goto, Keisuke, Ishikawa, Kazuo (1970) Method for Determining the Maximum Emission Depth of True Secondary Electrons by Means of Retarding Characteristics. Journal of Applied Physics, 41 (12). 4823-4825 doi:10.1063/1.1658546
Koshida, Nobuyoshi, Yoshida, Shigetomo (1983) Secondary Electron Emission from Polyvinylidene Fluoride (PVDF) Film. Japanese Journal of Applied Physics, 22. 1744 doi:10.1143/jjap.22.1744
 
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