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Ishii, Makoto, Hashimoto, Hatsujiro (1967) Electron Microscopic Observation of Oxides Formed on Thin Film of Copper at Elevated Temperature. Japanese Journal of Applied Physics, 6 (2) 173-180 doi:10.1143/jjap.6.173

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Reference TypeJournal (article/letter/editorial)
TitleElectron Microscopic Observation of Oxides Formed on Thin Film of Copper at Elevated Temperature
JournalJapanese Journal of Applied Physics
AuthorsIshii, MakotoAuthor
Hashimoto, HatsujiroAuthor
Year1967 (February)Volume6
Issue2
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.6.173Search in ResearchGate
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Mindat Ref. ID14976786Long-form Identifiermindat:1:5:14976786:8
GUID0
Full ReferenceIshii, Makoto, Hashimoto, Hatsujiro (1967) Electron Microscopic Observation of Oxides Formed on Thin Film of Copper at Elevated Temperature. Japanese Journal of Applied Physics, 6 (2) 173-180 doi:10.1143/jjap.6.173
Plain TextIshii, Makoto, Hashimoto, Hatsujiro (1967) Electron Microscopic Observation of Oxides Formed on Thin Film of Copper at Elevated Temperature. Japanese Journal of Applied Physics, 6 (2) 173-180 doi:10.1143/jjap.6.173
In(1967, February) Japanese Journal of Applied Physics Vol. 6 (2) Japan Society of Applied Physics

See Also

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Ishii, Makoto, Hashimoto, Hatsujiro (1969) Electron Microscopic Observation of Oxide Crystals Grown on Thin Film of α-Brass at Elevated Temperature. Japanese Journal of Applied Physics, 8 (9) 1107-1113 doi:10.1143/jjap.8.1107
Kaito, Chihiro, Fujita, Kazuo, Hashimoto, Hatsujiro (1974) Electron-Microscopic Studies of Morphology and Growth Rate of Oxide Layers Formed on Co, Mn and Mg Fine Particles. Japanese Journal of Applied Physics, 13 (7) 1058-1060 doi:10.1143/jjap.13.1058
Hashimoto, Hatsujiro, Kodera, Minoru (1969) Moiré Patterns Appearing in the Electron Microscopic Images of Grain Boundaries. Japanese Journal of Applied Physics, 8 (12) 1390-1396 doi:10.1143/jjap.8.1390
Kaito, Chihiro, Fujita, Kazuo, Hashimoto, Hatsujiro (1973) Electron-Microscopic Study of Oxidation Processes by Metal Fine Particles. Japanese Journal of Applied Physics, 12 (4) 489-496 doi:10.1143/jjap.12.489
Yokota, Yasuhiro, Hashimoto, Hatsujiro, Saito, Noritsugu, Endoh, Hisamitsu (1986) Electron Microscope Observation of Au/Si (111) Interface in Atomic Level. Japanese Journal of Applied Physics, 25. doi:10.1143/jjap.25.l168
Kaito, Chihiro, Fujita, Kazuo, Shiojiri, Makoto (1983) High-Resolution Electron Microscopic Study of Oxides Formed by Coalescence of Smoke Particles of Bi2O3and WO3. Japanese Journal of Applied Physics, 22. 252-257 doi:10.1143/jjap.22.252
Ajika, Natsuo, Hashimoto, Hatsujiro, Yamaguchi, Koji, Endoh, Hisamitsu (1985) Atomic Structure Images Formed by Plasma-Loss Electrons. Japanese Journal of Applied Physics, 24. doi:10.1143/jjap.24.l41
Hashimoto, Hatsujiro, Naiki, Toshio, Eto, Terukazu, Fujiwara, Kishio (1968) High Temperature Gas Reaction Specimen Chamber for an Electron Microscope. Japanese Journal of Applied Physics, 7 (8) 946-952 doi:10.1143/jjap.7.946
Fujime, Satoru (1967) Supplement to “Electron Diffraction at Low Temperature” Radial Distribution Analysis of a Film Composed of Very Fine Crystallites. Japanese Journal of Applied Physics, 6 (2) 270 doi:10.1143/jjap.6.270
Shiojiri, Makoto, Maeda, Shigeo, Murata, Yukio (1969) Electron Microscopic Observation on Sulphuration of Vacuum-Deposited Silver Films. Japanese Journal of Applied Physics, 8 (1) 24-31 doi:10.1143/jjap.8.24
Suito, Eiji, Shiojiri, Makoto, Morikawa, Hiroshi (1966) Electron Microscopic Observation on Heat Oxidation of Vacuum-Deposited Aluminium Films. Japanese Journal of Applied Physics, 5 (12) 1197-1203 doi:10.1143/jjap.5.1197
 
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