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Chisaka, Haruo, Morita, Eiichi, Takeda, Shigeru, Masuda, Masayoshi (1967) Effects of Oxidation on Surface-Barrier Detectors. Japanese Journal of Applied Physics, 6 (4) 542-543 doi:10.1143/jjap.6.542

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Reference TypeJournal (article/letter/editorial)
TitleEffects of Oxidation on Surface-Barrier Detectors
JournalJapanese Journal of Applied Physics
AuthorsChisaka, HaruoAuthor
Morita, EiichiAuthor
Takeda, ShigeruAuthor
Masuda, MasayoshiAuthor
Year1967 (April)Volume6
Issue4
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.6.542Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14976869Long-form Identifiermindat:1:5:14976869:8
GUID0
Full ReferenceChisaka, Haruo, Morita, Eiichi, Takeda, Shigeru, Masuda, Masayoshi (1967) Effects of Oxidation on Surface-Barrier Detectors. Japanese Journal of Applied Physics, 6 (4) 542-543 doi:10.1143/jjap.6.542
Plain TextChisaka, Haruo, Morita, Eiichi, Takeda, Shigeru, Masuda, Masayoshi (1967) Effects of Oxidation on Surface-Barrier Detectors. Japanese Journal of Applied Physics, 6 (4) 542-543 doi:10.1143/jjap.6.542
In(1967, April) Japanese Journal of Applied Physics Vol. 6 (4) Japan Society of Applied Physics

See Also

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Chisaka, Haruo, Morita, Eiichi, Masuda, Masayoshi (1971) Surface Effects in Silicon Surface Barrier Diode. Japanese Journal of Applied Physics, 10 (8) 1110 doi:10.1143/jjap.10.1110
Chisaka, Haruo (1973) Radiation Damage Effects on Silicon Surface Barrier Nuclear Detectors. Japanese Journal of Applied Physics, 12 (3) 439-444 doi:10.1143/jjap.12.439
Morita, Eiichi, Takase, Masanori (1967) Angular Distribution of Light Emitted from the Optical Fiber Bundle. Japanese Journal of Applied Physics, 6 (3) 414-415 doi:10.1143/jjap.6.414
Masuda, M., Takeda, S., Chisaka, H. (1967) Leakage current and noises in surface barrier particle detectors. Nuclear Instruments and Methods, 49 (1). 77-85 doi:10.1016/0029-554x(67)90665-9
Nemoto, Tomihiro, Nakano, Tomoyasu (1967) The Effect of Silicon on Cuprous Oxide. Japanese Journal of Applied Physics, 6 (4) 543-544 doi:10.1143/jjap.6.543
CHISAKA, Haruo (1972) Surface Treatment of Surface Barrier Nuclear Detectors. RADIOISOTOPES, 21. 298-299 doi:10.3769/radioisotopes.21.5_298
Enomoto, Tatsuya, Ando, Ryo, Morita, Hiroshi, Nakayama, Haruo (1978) Thermal Oxidation Rate of a Si3N4Film and Its Masking Effect against Oxidation of Silicon. Japanese Journal of Applied Physics, 17 (6) 1049-1058 doi:10.1143/jjap.17.1049
Yamagishi, Haruo, Miyauchi, Masayoshi (1987) Thermal Oxidation of Sputtered TaN Films and Properties of the Oxidized Films. Japanese Journal of Applied Physics, 26. 852-855 doi:10.1143/jjap.26.852
Furukawa, Yoshitaka, Ishibashi, Yoshio (1967) Trapping Effects in Au-n-Type GaAs Schottky Barrier Diodes. Japanese Journal of Applied Physics, 6 (4) 503-508 doi:10.1143/jjap.6.503
Ishimoto, Shigeru, Isagawa, Shigeru, Masuda, Yasuhiro, Morimoto, Kimio, Nakajima, Tetsuo, Masaike, Akira, Ishida, Masayoshi, Ishikawa, Yoshikazu, Kohgi, Masahumi, Newsam, John M. (1986) Slow Neutron Polarization by Longitudinally Polarized Proton Filter. Japanese Journal of Applied Physics, 25. doi:10.1143/jjap.25.l246
McCrum, N. G., Morris, E. L. (1965) On the Analysis of Mechanical Relaxation in Polytetrafluoroethylene. Japanese Journal of Applied Physics, 4 (7) 542-543 doi:10.1143/jjap.4.542
 
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