Reference Type | Journal (article/letter/editorial) |
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Title | Disturbance Caused by Probes in the Electric Field Measurement in a Magnetized DC Discharge Plasma |
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Journal | Japanese Journal of Applied Physics |
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Authors | Kawaguchi, Motoichi | Author |
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Tanaka, Hiroyoshi | Author |
Year | 1978 (September) | Volume | 17 |
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Issue | 9 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.17.1613Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14982823 | Long-form Identifier | mindat:1:5:14982823:1 |
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GUID | 0 |
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Full Reference | Kawaguchi, Motoichi, Tanaka, Hiroyoshi (1978) Disturbance Caused by Probes in the Electric Field Measurement in a Magnetized DC Discharge Plasma. Japanese Journal of Applied Physics, 17 (9) 1613-1617 doi:10.1143/jjap.17.1613 |
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Plain Text | Kawaguchi, Motoichi, Tanaka, Hiroyoshi (1978) Disturbance Caused by Probes in the Electric Field Measurement in a Magnetized DC Discharge Plasma. Japanese Journal of Applied Physics, 17 (9) 1613-1617 doi:10.1143/jjap.17.1613 |
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In | (1978, September) Japanese Journal of Applied Physics Vol. 17 (9) Japan Society of Applied Physics |
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