Gibbons, J. F. (1980) (Invited) Applications of Scanning CW Lasers and Electron Beams in Silicon Technology. Japanese Journal of Applied Physics, 19. 121 doi:10.7567/jjaps.19s1.121
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | (Invited) Applications of Scanning CW Lasers and Electron Beams in Silicon Technology | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Gibbons, J. F. | Author | |
Year | 1980 (January 1) | Volume | 19 |
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.7567/jjaps.19s1.121Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14983413 | Long-form Identifier | mindat:1:5:14983413:3 |
GUID | 0 | ||
Full Reference | Gibbons, J. F. (1980) (Invited) Applications of Scanning CW Lasers and Electron Beams in Silicon Technology. Japanese Journal of Applied Physics, 19. 121 doi:10.7567/jjaps.19s1.121 | ||
Plain Text | Gibbons, J. F. (1980) (Invited) Applications of Scanning CW Lasers and Electron Beams in Silicon Technology. Japanese Journal of Applied Physics, 19. 121 doi:10.7567/jjaps.19s1.121 | ||
In | (1980) Japanese Journal of Applied Physics Vol. 19. Japan Society of Applied Physics |
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