Murrmann, Helmuth, Kranzer, Ditmar (1980) Yield Modeling of Bipolar Integrated Circuits. Japanese Journal of Applied Physics, 19. 169 doi:10.7567/jjaps.19s1.169
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Yield Modeling of Bipolar Integrated Circuits | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Murrmann, Helmuth | Author | |
Kranzer, Ditmar | Author | ||
Year | 1980 (January 1) | Volume | 19 |
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.7567/jjaps.19s1.169Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14983423 | Long-form Identifier | mindat:1:5:14983423:2 |
GUID | 0 | ||
Full Reference | Murrmann, Helmuth, Kranzer, Ditmar (1980) Yield Modeling of Bipolar Integrated Circuits. Japanese Journal of Applied Physics, 19. 169 doi:10.7567/jjaps.19s1.169 | ||
Plain Text | Murrmann, Helmuth, Kranzer, Ditmar (1980) Yield Modeling of Bipolar Integrated Circuits. Japanese Journal of Applied Physics, 19. 169 doi:10.7567/jjaps.19s1.169 | ||
In | (1980) Japanese Journal of Applied Physics Vol. 19. Japan Society of Applied Physics |
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