Reference Type | Journal (article/letter/editorial) |
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Title | Scanning Acoustic Microscopy for Study of Interfaces in Solid-State Devices |
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Journal | Japanese Journal of Applied Physics |
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Authors | Tsai, C. S. | Author |
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Wang, J. K. | Author |
Lee, C. C. | Author |
Year | 1980 (January 1) | Volume | 19 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.7567/jjaps.19s1.249Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14983437 | Long-form Identifier | mindat:1:5:14983437:9 |
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GUID | 0 |
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Full Reference | Tsai, C. S., Wang, J. K., Lee, C. C. (1980) Scanning Acoustic Microscopy for Study of Interfaces in Solid-State Devices. Japanese Journal of Applied Physics, 19. 249 doi:10.7567/jjaps.19s1.249 |
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Plain Text | Tsai, C. S., Wang, J. K., Lee, C. C. (1980) Scanning Acoustic Microscopy for Study of Interfaces in Solid-State Devices. Japanese Journal of Applied Physics, 19. 249 doi:10.7567/jjaps.19s1.249 |
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In | (1980) Japanese Journal of Applied Physics Vol. 19. Japan Society of Applied Physics |
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