Hirabayashi, Izumi, Morigaki, Kazuo, Nitta, Shoji (1980) New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon. Japanese Journal of Applied Physics, 19 (7) doi:10.1143/jjap.19.l357
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Hirabayashi, Izumi | Author | |
Morigaki, Kazuo | Author | ||
Nitta, Shoji | Author | ||
Year | 1980 (July) | Volume | 19 |
Issue | 7 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.19.l357Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14984197 | Long-form Identifier | mindat:1:5:14984197:1 |
GUID | 0 | ||
Full Reference | Hirabayashi, Izumi, Morigaki, Kazuo, Nitta, Shoji (1980) New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon. Japanese Journal of Applied Physics, 19 (7) doi:10.1143/jjap.19.l357 | ||
Plain Text | Hirabayashi, Izumi, Morigaki, Kazuo, Nitta, Shoji (1980) New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon. Japanese Journal of Applied Physics, 19 (7) doi:10.1143/jjap.19.l357 | ||
In | (1980, July) Japanese Journal of Applied Physics Vol. 19 (7) Japan Society of Applied Physics |
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