Reference Type | Journal (article/letter/editorial) |
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Title | Field-Ion Microscope Observation of Thermal Faceting in Ni4Mo Emitter |
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Journal | Japanese Journal of Applied Physics |
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Authors | Kingetsu, Toshiki | Author |
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Yamamoto, Masahiko | Author |
Nenno, Soji | Author |
Year | 1981 (November) | Volume | 20 |
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Issue | 11 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.20.2037Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14984676 | Long-form Identifier | mindat:1:5:14984676:1 |
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GUID | 0 |
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Full Reference | Kingetsu, Toshiki, Yamamoto, Masahiko, Nenno, Soji (1981) Field-Ion Microscope Observation of Thermal Faceting in Ni4Mo Emitter. Japanese Journal of Applied Physics, 20 (11) 2037-2046 doi:10.1143/jjap.20.2037 |
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Plain Text | Kingetsu, Toshiki, Yamamoto, Masahiko, Nenno, Soji (1981) Field-Ion Microscope Observation of Thermal Faceting in Ni4Mo Emitter. Japanese Journal of Applied Physics, 20 (11) 2037-2046 doi:10.1143/jjap.20.2037 |
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In | (1981, November) Japanese Journal of Applied Physics Vol. 20 (11) Japan Society of Applied Physics |
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