Matsui, Yoshio, Takayama-Muromachi, Eiji, Ono, Akira, Horiuchi, Shigeo, Kato, Katsuo (1987) High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l777
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Matsui, Yoshio | Author | |
Takayama-Muromachi, Eiji | Author | ||
Ono, Akira | Author | ||
Horiuchi, Shigeo | Author | ||
Kato, Katsuo | Author | ||
Year | 1987 (May 20) | Volume | 26 |
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.26.l777Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14990411 | Long-form Identifier | mindat:1:5:14990411:9 |
GUID | 0 | ||
Full Reference | Matsui, Yoshio, Takayama-Muromachi, Eiji, Ono, Akira, Horiuchi, Shigeo, Kato, Katsuo (1987) High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l777 | ||
Plain Text | Matsui, Yoshio, Takayama-Muromachi, Eiji, Ono, Akira, Horiuchi, Shigeo, Kato, Katsuo (1987) High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l777 | ||
In | (1987) Japanese Journal of Applied Physics Vol. 26. Japan Society of Applied Physics |
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